Zobrazeno 1 - 10
of 53
pro vyhledávání: '"Veit B. Kleeberger"'
Autor:
Veit B. Kleeberger, Wolfgang Rosenstiel, Peter Marwedel, Sani R. Nassif, Johannes Maximilian Kühn, Semeen Rehman, Michael Glaß, Andreas Herkersdorf, Ulf Schlichtmann, Muhammad Shafique, Daniel Mueller-Gritschneder, Jorg Henkel, Norbert Wehn, Michael Engel, Jürgen Teich, Christian Weis
Publikováno v:
Dependable Embedded Systems ISBN: 9783030520168
The Resilience Articulation Point (RAP) model aims to provision a probabilistic fault abstraction and error propagation concept for various forms of variability related faults in deep sub-micron CMOS technologies at the semiconductor material or devi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::335a0b1530854c54bbb032219108cc2d
https://doi.org/10.1007/978-3-030-52017-5_1
https://doi.org/10.1007/978-3-030-52017-5_1
Autor:
Daniel Mueller-Gritschneder, Veit B. Kleeberger, Eric Cheng, Uzair Sharif, Subhasish Mitra, Ulf Schlichtmann, Pradip Bose
Publikováno v:
Dependable Embedded Systems ISBN: 9783030520168
Driven by technology scaling, integrated systems become more susceptible to various causes of random hardware faults such as radiation-induced soft errors. Such soft errors may cause malfunction of the system due to corruption of data or control flow
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e52ed299a5a7f07342d51ba0eae543ad
https://doi.org/10.1007/978-3-030-52017-5_11
https://doi.org/10.1007/978-3-030-52017-5_11
Publikováno v:
ACM Transactions on Embedded Computing Systems. 17:1-26
Robustness against errors in hardware must be considered from the very beginning of safety-critical system-on-chip firmware design. Therefore, we present fault injection for test-driven development (TDD) of robust firmware. As TDD is based on instant
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::923440f7f82e0b311fb923e0b30c6b51
https://doi.org/10.1145/3092943
https://doi.org/10.1145/3092943
Publikováno v:
Microelectronics Reliability. 61:30-34
Technology scaling has an increasing impact on the resilience of integrated circuits. This leads to the necessity of using new technology-level innovations, such as employing FinFET instead of planar transistors. For such novel devices, performance c
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9d4c37f515c29440c132f661ee763f3f
https://doi.org/10.1016/j.microrel.2015.12.039
https://doi.org/10.1016/j.microrel.2015.12.039
Publikováno v:
Advances in Radio Science, Vol 11, Pp 213-218 (2013)
Die kontinuierlich fortschreitende Miniaturisierung in integrierten Schaltungen führt zu einem erhöhten Modellierungsbedarf verschiedenster Effekte, wie z.B. Alterung oder Stromverbrauch. Diese hängen von den auftretenden Signalen innerhalb der Sc
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::d1950e297dde5a2944616cdf345001f9
https://www.adv-radio-sci.net/11/213/2013/
https://www.adv-radio-sci.net/11/213/2013/
Autor:
Veit B. Kleeberger, Ulf Schlichtmann
Publikováno v:
Advances in Radio Science, Vol 9, Pp 273-280 (2011)
Die kontinuierlich fortschreitende Miniaturisierung in integrierten Schaltungen führt zu einem Anstieg des intrinsischen Rauschens. Um den Einfluss von intrinsischem Rauschen auf die Zuverlässigkeit zukünftiger digitaler Schaltungen analysieren zu
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::36d714f80c762096f6b9636b90526047
https://www.adv-radio-sci.net/9/273/2011/
https://www.adv-radio-sci.net/9/273/2011/
Autor:
Mehdi B. Tahoori, Hananeh Aliee, Fabian Oboril, Alexandra Listl, Veit B. Kleeberger, Michael Glaß, Mojtaba Ebrahimi, Ulf Schlichtmann, Norbert Wehn, Jürgen Teich, Liang Chen, Daniel Muller-Gritschneder, Faramarz Khosravi, Christian Weis
Publikováno v:
it - Information Technology. 57:159-169
The increasing error susceptibility of semiconductor devices has put reliability in the focus of modern design methodologies. Low-level techniques alone cannot economically tackle this problem. Instead, counter measures on all system layers from devi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d07460b4c68074aed16433be52b2916d
https://doi.org/10.1515/itit-2014-1080
https://doi.org/10.1515/itit-2014-1080
Autor:
Johannes Maximilian Kühn, Christina Gimmler-Dumont, Michael Glaß, Veit B. Kleeberger, Daniel Mueller-Gritschneder, Wolfgang Rosenstiel, Jorg Henkel, Michael A. Kochte, Sani R. Nassif, Holm Rauchfuss, Andreas Herkersdorf, Hans-Joachim Wunderlich, Muhammad Shafique, Norbert Wehn, Mehdi B. Tahoori, Hananeh Aliee, Ulf Schlichtmann, Jürgen Teich, Michael Engel, Christian Weis
Publikováno v:
Microelectronics Reliability. 54:1066-1074
The Resilience Articulation Point (RAP) model aims at provisioning researchers and developers with a probabilistic fault abstraction and error propagation framework covering all hardware/software layers of a System on Chip. RAP assumes that physicall
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e22a32936a18bb5f70d8c7d8b6dd06d1
https://doi.org/10.1016/j.microrel.2013.12.012
https://doi.org/10.1016/j.microrel.2013.12.012
Autor:
Doris Schmitt-Landsiedel, Veit B. Kleeberger, Martin Barke, Ulf Schlichtmann, Christoph Werner
Publikováno v:
Microelectronics Reliability. 54:1083-1089
We present an aging analysis which considers variations in chip environment and workload as they are caused by dynamic voltage or frequency scaling, power-down modes, etc. Therefore, we developed a model for NBTI degradation and recovery based on tra
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b1a75d340f760898de74e73398bdccf2
https://doi.org/10.1016/j.microrel.2013.12.002
https://doi.org/10.1016/j.microrel.2013.12.002
Autor:
Veit B. Kleeberger, Christina Gimmler-Dumont, Andreas Herkersdorf, Norbert Wehn, Sani R. Nassif, Christian Weis, Ulf Schlichtmann, Daniel Mueller-Gritschneder
Publikováno v:
IEEE Micro
Highly scaled technologies at and beyond the 22-nm node exhibit increased sensitivity to various scaling-related problems that conspire to reduce the overall reliability of integrated circuits and systems. In prior technology nodes, the assumption wa
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::35d640ce5ae1cee34f8d691b56d3431e
https://doi.org/10.1109/mm.2013.67
https://doi.org/10.1109/mm.2013.67