Automated EELS Core-Loss Edge Detection for Quantification of the Chemical Composition of Nano-Structured Semiconductors

Autor: Veerendra C. Angadi, Charith Abhayaratne, Thomas Walther

Publikováno v: Encyclopedia of Materials: Electronics ISBN: 9780128197356

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::dd5c5417ef626d0735ce388ad3e5bce6
https://doi.org/10.1016/b978-0-12-819728-8.00007-3

Regressive Event-Tracker: A Causal Prediction Modelling of Degradation in High Speed Manufacturing

Autor: Matteo Tellarini, Veerendra C. Angadi, Alireza Mousavi, Matteo Fazziani, Diego Bartolomé

Publikováno v: 30th International Conference on Flexible Automation and Intelligent Manufacturing
Procedia Manufacturing

The proposed work describes a dynamic regression based event-tracker for high speed production process. The methodology discussed is a causal system and provides trends and estimations of the sensors based on a flexible regression model of the histor

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::3dc5e47c339a6c540c323988b23bc5a6
https://zenodo.org/record/4741895

Study of phase separation in an InGaN alloy by electron energy loss spectroscopy in an aberration corrected monochromated scanning transmission electron microscope

Autor: X. Wang, Pierre Ruterana, Toshihiro Aoki, Veerendra C. Angadi, Thomas Walther, Paolo Longo

Publikováno v: Journal of Materials Research
Journal of Materials Research, Cambridge University Press (CUP), 2017, 32 (5), pp.983-995. ⟨10.1557/jmr.2016.447⟩
Journal of Materials Research, 2017, 32 (5), pp.983-995. ⟨10.1557/jmr.2016.447⟩

Phase separation of InxGa1−xN into Ga-rich and In-rich regions has been studied by electron energy-loss spectroscopy (EELS) in a monochromated, aberration corrected scanning transmission electron microscope (STEM). We analyze the full spectral info

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::cf213c4ce36628867a0bc9755396313b
https://doi.org/10.1557/jmr.2016.447

Influence of background subtraction and deconvolution on calculation of EELS core-loss intensities

Autor: Veerendra C Angadi, Thomas Walther

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::f86c1c0117b9d6011c994bc8108b4b94
https://doi.org/10.1002/9783527808465.emc2016.6237

Automated background subtraction technique for electron energy-loss spectroscopy and application to semiconductor heterostructures

Autor: Veerendra C, Angadi, Charith, Abhayaratne, Thomas, Walther

Publikováno v: Journal of microscopy. 262(2)

Electron energy-loss spectroscopy (EELS) has become a standard tool for identification and sometimes also quantification of elements in materials science. This is important for understanding the chemical and/or structural composition of processed mat

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=pmid________::2e3a846983ad2290c38ed2b64091e273
https://pubmed.ncbi.nlm.nih.gov/26998582