Zobrazeno 1 - 7
of 7
pro vyhledávání: '"Veenadhar, Katragadda"'
Autor:
Veenadhar, Katragadda
Network structure plays a significant role in determining the performance of network inference tasks. An interactive tool to study the dependence of network topology on estimation performance was developed. The tool allows end-users to easily create
Externí odkaz:
https://digital.library.unt.edu/ark:/67531/metadc149617/
Autor:
Ishtiaq Ahsan, Arthur Gasasira, Vijay Narayanan, Soon-Cheon Seo, Xuefeng Liu, Veenadhar Katragadda, Takashi Ando, Nicole Saulnier, Youngseok Kim, Ruturaj Pujari, Dexin Kong, Sean Teehan
Publikováno v:
2021 32nd Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC).
In this paper we demonstrate a novel methodology to electrically test and characterize resistive random-access memory (RRAM) single bit devices for deep learning application. We extract critical device performance metrics for validating and optimizin
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8d6b6e5e454cc3929b87f5dd640f81c5
https://doi.org/10.1109/asmc51741.2021.9435708
https://doi.org/10.1109/asmc51741.2021.9435708
Autor:
Justin Clements, Vandana Venkatasubramanian, Christa Montgomery, Eswar Ramanathan, Jeffrey Riendeau, Veenadhar Katragadda, Alan Cusick, Edwin Soler, Qiushi Wang, Jay Mody, Lloyd Smith, Arthur Gasasira, Shafaat Ahmed, Colin Bombardier, Petrov Nicolai, Bill Evans, Raymond Krom, Martin Muthee, Michael Hatzistergos, Owen Brown, Jung Tae Hwang, Jian Qiu, Vincent Liao, Kok Hin Teo
Publikováno v:
2019 30th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC).
Inline electrical testing in a semiconductor fabrication line is a very common method to monitor the line performance and to be able to detect any issue for the tested wafers. This helps to detect the problems much earlier. Detecting issues earlier n
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ff7464b8c4d2cfd95d8c83042d070e96
https://doi.org/10.1109/asmc.2019.8791826
https://doi.org/10.1109/asmc.2019.8791826
Publikováno v:
2019 IEEE 32nd International Conference on Microelectronic Test Structures (ICMTS).
Advancement in technology scaling has enabled further integration of additional structures per area. While the direct benefits of improved performance in smaller packaging is achieved, the test content per structure has increased for quicker and bett
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::690765be81aa86c026862b015c47d89e
https://doi.org/10.1109/icmts.2019.8730979
https://doi.org/10.1109/icmts.2019.8730979
Publikováno v:
2018 IEEE International Conference on Microelectronic Test Structures (ICMTS).
Parallel test capability, enabled by numerous independent measurement channels has significantly increased throughput in parametric testing. It involves testing of numerous devices simultaneously synchronously or asynchronously. The number of devices
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c0f997b1730d0fc277f06836ccdda760
https://doi.org/10.1109/icmts.2018.8383784
https://doi.org/10.1109/icmts.2018.8383784
Publikováno v:
International Journal of Robust and Nonlinear Control. 25:1438-1453
Summary We examine the role played by a linear dynamical network's topology in inference of its eigenvalues from noisy impulse-response data. Specifically, for a canonical linear-time-invariant network dynamics, we relate the Cramer–Rao bounds on e
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0f90d4cd4f94be21e7c2e769f02075ac
https://doi.org/10.1002/rnc.3149
https://doi.org/10.1002/rnc.3149
Publikováno v:
Infotech@Aerospace
Network structure plays a significant role in determining the performance of network inference tasks. An interactive tool to study the dependence of network topology on estimation performance was developed. The tool allows end-users to easily create
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d9217d094bb4ca128b464cf763aea2db
https://doi.org/10.2514/6.2012-2469
https://doi.org/10.2514/6.2012-2469