Zobrazeno 1 - 4
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pro vyhledávání: '"Veen, G. van der"'
Autor:
Keyvani Janbahan, A., Veen, G. van der, Tamer, M.S., Sadeghian Marnani, H., Goosen, H., Keulen, F. van
Publikováno v:
IEEE Transactions on Nanotechnology, 19, 274-283
The real-time and accurate measurement of tip-sample interaction forces in Tapping Mode Atomic Force Microscopy (TM-AFM) is a remaining challenge. This obstruction fundamentally stems from the causality of the physical systems. Since the input of the
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::19d45b28e20f3414d16e0d49252f8862
http://resolver.tudelft.nl/uuid:ef0a6ae2-a39a-49f1-b3d9-845ed0d1393a
http://resolver.tudelft.nl/uuid:ef0a6ae2-a39a-49f1-b3d9-845ed0d1393a
Publikováno v:
Photochemistry & Photobiology; Mar1974, Vol. 19 Issue 3, p197-204, 8p
Autor:
Veen, G. van der, Prins, W.
Publikováno v:
Photochemistry & Photobiology; Mar1974, Vol. 19 Issue 3, p191-196, 6p
Publikováno v:
Biomaterials; 1994, Vol. 15 Issue: 10 p766-766, 1p