Ueber einige Gefässkrankheiten. (Sopra alcune malattie dei vasi) J. Westerdijk A. Van Luijk

Publikováno v: Rivista di Patologia Vegetale, 1925 Jan 01. 15(1/2), 9-9.

Externí odkaz: https://www.jstor.org/stable/42560517

Photovoltaics at multi-terawatt scale: Waiting is not an option.

Autor: Haegel NM; Author affiliations are listed in the supplementary materials., Verlinden P; Author affiliations are listed in the supplementary materials., Victoria M; Author affiliations are listed in the supplementary materials., Altermatt P; Author affiliations are listed in the supplementary materials., Atwater H; Author affiliations are listed in the supplementary materials., Barnes T; Author affiliations are listed in the supplementary materials., Breyer C; Author affiliations are listed in the supplementary materials., Case C; Author affiliations are listed in the supplementary materials., De Wolf S; Author affiliations are listed in the supplementary materials., Deline C; Author affiliations are listed in the supplementary materials., Dharmrin M; Author affiliations are listed in the supplementary materials., Dimmler B; Author affiliations are listed in the supplementary materials., Gloeckler M; Author affiliations are listed in the supplementary materials., Goldschmidt JC; Author affiliations are listed in the supplementary materials., Hallam B; Author affiliations are listed in the supplementary materials., Haussener S; Author affiliations are listed in the supplementary materials., Holder B; Author affiliations are listed in the supplementary materials., Jaeger U; Author affiliations are listed in the supplementary materials., Jaeger-Waldau A; Author affiliations are listed in the supplementary materials., Kaizuka I; Author affiliations are listed in the supplementary materials., Kikusato H; Author affiliations are listed in the supplementary materials., Kroposki B; Author affiliations are listed in the supplementary materials., Kurtz S; Author affiliations are listed in the supplementary materials., Matsubara K; Author affiliations are listed in the supplementary materials., Nowak S; Author affiliations are listed in the supplementary materials., Ogimoto K; Author affiliations are listed in the supplementary materials., Peter C; Author affiliations are listed in the supplementary materials., Peters IM; Author affiliations are listed in the supplementary materials., Philipps S; Author affiliations are listed in the supplementary materials., Powalla M; Author affiliations are listed in the supplementary materials., Rau U; Author affiliations are listed in the supplementary materials., Reindl T; Author affiliations are listed in the supplementary materials., Roumpani M; Author affiliations are listed in the supplementary materials., Sakurai K; Author affiliations are listed in the supplementary materials., Schorn C; Author affiliations are listed in the supplementary materials., Schossig P; Author affiliations are listed in the supplementary materials., Schlatmann R; Author affiliations are listed in the supplementary materials., Sinton R; Author affiliations are listed in the supplementary materials., Slaoui A; Author affiliations are listed in the supplementary materials., Smith BL; Author affiliations are listed in the supplementary materials., Schneidewind P; Author affiliations are listed in the supplementary materials., Stanbery BJ; Author affiliations are listed in the supplementary materials., Topic M; Author affiliations are listed in the supplementary materials., Tumas W; Author affiliations are listed in the supplementary materials., Vasi J; Author affiliations are listed in the supplementary materials., Vetter M; Author affiliations are listed in the supplementary materials., Weber E; Author affiliations are listed in the supplementary materials., Weeber AW; Author affiliations are listed in the supplementary materials., Weidlich A; Author affiliations are listed in the supplementary materials., Weiss D; Author affiliations are listed in the supplementary materials., Bett AW; Author affiliations are listed in the supplementary materials.

Publikováno v: Science (New York, N.Y.) [Science] 2023 Apr 07; Vol. 380 (6640), pp. 39-42. Date of Electronic Publication: 2023 Apr 06.

The nature of the hole traps in reoxidized nitrided oxide gate dielectrics.

Autor: Mallik, A., Vasi, J., Chandorkar, A. N.

Publikováno v: Journal of Applied Physics; 8/15/1993, Vol. 74 Issue 4, p2665, 4p, 6 Graphs

Low temperature-high pressure grown thin gate dielectrics for MOS applications

Autor: Ramgopal Rao, V., Hansch, W., Mahapatra, S., Sharma, D.K., Vasi, J., Grabolla, T., Eisele, I.

Publikováno v: In Microelectronic Engineering 1999 48(1):223-226

A direct charge pumping technique for spatial profiling of hot-carrier induced interface and oxide traps in MOSFETs

Autor: Mahapatra, S ^*, Parikh, C.D, Vasi, J, Ramgopal Rao, V, Viswanathan, C.R

Publikováno v: In Solid State Electronics 1999 43(5):915-922