Zobrazeno 1 - 10
of 20
pro vyhledávání: '"Vasconcelos TL"'
Autor:
Vasconcelos, TL, Archanjo, BS, Oliveira, BS, Valaski, R, Cordeiro, RC, Medeiros, HG, Rabelo, C, Ribeiro, A, Ercius, P, Achete, CA, Jorio, A, Cançado, LG
Publikováno v:
Vasconcelos, TL; Archanjo, BS; Oliveira, BS; Valaski, R; Cordeiro, RC; Medeiros, HG; et al.(2018). Plasmon-Tunable Tip Pyramids: Monopole Nanoantennas for Near-Field Scanning Optical Microscopy. Advanced Optical Materials, 6(20). doi: 10.1002/adom.201800528. Lawrence Berkeley National Laboratory: Retrieved from: http://www.escholarship.org/uc/item/010464zt
Advanced Optical Materials, vol 6, iss 20
Advanced Optical Materials, vol 6, iss 20
© 2018 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim Squeezing optical fields into nanometer scale is the key step to perform spatially resolved near-field optics. In scattering-type near-field optical microscopy, this task is accomplished by nanoanten
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::9db1c908339d4de7ec359795d130b9ad
http://www.escholarship.org/uc/item/010464zt
http://www.escholarship.org/uc/item/010464zt
Publikováno v:
Archanjo, BS; Vasconcelos, TL; Oliveira, BS; Song, C; Allen, FI; Achete, CA; et al.(2018). Plasmon 3D Electron Tomography and Local Electric-Field Enhancement of Engineered Plasmonic Nanoantennas. ACS Photonics, 5(7), 2834-2842. doi: 10.1021/acsphotonics.8b00125. Lawrence Berkeley National Laboratory: Retrieved from: http://www.escholarship.org/uc/item/7db3f16q
ACS Photonics, vol 5, iss 7
ACS Photonics, vol 5, iss 7
© 2018 American Chemical Society. Plasmonic nanoantennas are pushing the limits of optical imaging resolution capabilities in near-field scanning optical microscopy (NSOM). Accordingly, these techniques are driving the basic understanding of photoni
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::0ab6cf1a78f6a866ab1be729a7a21ef1
http://www.escholarship.org/uc/item/7db3f16q
http://www.escholarship.org/uc/item/7db3f16q
Autor:
Rodrigues GLC; Federal Institute of Piauí (IFPI), Parnaíba 64211-145, PI, Brazil.; Interdisciplinary Laboratory of Advanced Materials (LIMAV), Materials Science and Engineering Graduate Program, Federal University of Piauí (UFPI), Teresina 64049-550, PI, Brazil., Oliveira TG; Interdisciplinary Laboratory of Advanced Materials (LIMAV), Materials Science and Engineering Graduate Program, Federal University of Piauí (UFPI), Teresina 64049-550, PI, Brazil., Gusmão SBS; Interdisciplinary Laboratory of Advanced Materials (LIMAV), Materials Science and Engineering Graduate Program, Federal University of Piauí (UFPI), Teresina 64049-550, PI, Brazil., Ferreira OP; Department of Chemistry, State University of Londrina, Londrina 86050-482, PR, Brazil., Vasconcelos TL; National Institute of Metrology, Quality and Technology (Inmetro), Duque de Caxias 25250-02, RJ, Brazil., Guerra Y; Department of Physics, Federal University of Piauí (UFPI), Teresina 64049-550, PI, Brazil., Milani R; Department of Physics, Federal University of Pernambuco (UFPE), Recife 50670-901, PE, Brazil., Peña-Garcia R; Interdisciplinary Laboratory of Advanced Materials (LIMAV), Materials Science and Engineering Graduate Program, Federal University of Piauí (UFPI), Teresina 64049-550, PI, Brazil.; Academic Unit of Cabo de Santo Agostinho, Federal Rural University of Pernambuco (UFRPE), Cabo de Santo Agostinho 50670-901, PE, Brazil., Viana BC; Interdisciplinary Laboratory of Advanced Materials (LIMAV), Materials Science and Engineering Graduate Program, Federal University of Piauí (UFPI), Teresina 64049-550, PI, Brazil.; Department of Physics, Federal University of Piauí (UFPI), Teresina 64049-550, PI, Brazil.
Publikováno v:
Materials (Basel, Switzerland) [Materials (Basel)] 2023 Feb 23; Vol. 16 (5). Date of Electronic Publication: 2023 Feb 23.
Autor:
Nazarkovsky M; Department of Chemistry, Pontifical Catholic University of Rio de Janeiro Marques de Sao Vicente, 225 22451-900 Rio de Janeiro Brazil., Mikhraliieva A; Department of Chemistry, Pontifical Catholic University of Rio de Janeiro Marques de Sao Vicente, 225 22451-900 Rio de Janeiro Brazil., Achete CA; Instituto Nacional de Metrologia, Qualidade e Tecnologia, Inmetro Av. Nossa Senhora das Graças, 50, Xerém Duque de Caxias 25250-020 Brazil., Alves LA; Laboratory of Cellular Communication, Oswaldo Cruz Institute, Oswaldo Cruz Foundation 4365 Manguinhos Rio de Janeiro 21045-900 Brazil., Araujo J; Instituto Nacional de Metrologia, Qualidade e Tecnologia, Inmetro Av. Nossa Senhora das Graças, 50, Xerém Duque de Caxias 25250-020 Brazil., Archanjo BS; Instituto Nacional de Metrologia, Qualidade e Tecnologia, Inmetro Av. Nossa Senhora das Graças, 50, Xerém Duque de Caxias 25250-020 Brazil., de Barros JJF; Laboratório de Virologia Molecular-LVM-IOC/FIOCRUZ/Rio de Janeiro-RJ-Brasil CEP 21041-210 Brazil., Cardoso LMDF; Laboratory of Cellular Communication, Oswaldo Cruz Institute, Oswaldo Cruz Foundation 4365 Manguinhos Rio de Janeiro 21045-900 Brazil., Couceiro JNSS; Instituto de Microbiologia Paulo de Góes, Universidade Federal do Rio de Janeiro Rio de Janeiro RJ 21941-902 Brazil., Marques FD; Instituto Nacional de Metrologia, Qualidade e Tecnologia, Inmetro Av. Nossa Senhora das Graças, 50, Xerém Duque de Caxias 25250-020 Brazil., Oliveira BS; Instituto Nacional de Metrologia, Qualidade e Tecnologia, Inmetro Av. Nossa Senhora das Graças, 50, Xerém Duque de Caxias 25250-020 Brazil., de Souza RND; Instituto Nacional de Metrologia, Qualidade e Tecnologia, Inmetro Av. Nossa Senhora das Graças, 50, Xerém Duque de Caxias 25250-020 Brazil., Teixeira AJ; Laboratory of Cellular Communication, Oswaldo Cruz Institute, Oswaldo Cruz Foundation 4365 Manguinhos Rio de Janeiro 21045-900 Brazil., Vasconcelos TL; Instituto Nacional de Metrologia, Qualidade e Tecnologia, Inmetro Av. Nossa Senhora das Graças, 50, Xerém Duque de Caxias 25250-020 Brazil., Zaitsev V; Department of Chemistry, Pontifical Catholic University of Rio de Janeiro Marques de Sao Vicente, 225 22451-900 Rio de Janeiro Brazil.; National University of Kyiv-Mohyla Academy 2 Skovorody Vul. Kyiv 04070 Ukraine v.zaytsev@ukma.edu.ua.
Publikováno v:
RSC advances [RSC Adv] 2022 May 12; Vol. 12 (23), pp. 14342-14355. Date of Electronic Publication: 2022 May 12 (Print Publication: 2022).
Autor:
Tschannen CD; Photonics Laboratory, ETH Zürich, 8093 Zürich, Switzerland., Frimmer M; Photonics Laboratory, ETH Zürich, 8093 Zürich, Switzerland., Vasconcelos TL; Materials Metrology Division, Instituto Nacional de Metrologia Qualidade e Tecnologia (INMETRO), 25250-020 Duque de Caxias, Rio de Janeiro, Brazil., Shi L; State Key Laboratory of Optoelectronic Materials and Technologies, Nanotechnology Research Center, Guangzhou Key Laboratory of Flexible Electronic Materials and Wearable Devices, School of Materials Science and Engineering, Sun Yat-sen University, Guangzhou 510275, P.R. China., Pichler T; Faculty of Physics, Universität Wien, 1090 Wien, Austria., Novotny L; Photonics Laboratory, ETH Zürich, 8093 Zürich, Switzerland.
Publikováno v:
Nano letters [Nano Lett] 2022 Apr 27; Vol. 22 (8), pp. 3260-3265. Date of Electronic Publication: 2022 Apr 13.
Autor:
Tschannen CD; Photonics Laboratory, ETH Zürich, 8093 Zürich, Switzerland., Vasconcelos TL; Materials Metrology Division, Instituto Nacional de Metrologia Qualidade e Tecnologia (INMETRO), 25250-020 Duque de Caxias, RJ, Brazil., Novotny L; Photonics Laboratory, ETH Zürich, 8093 Zürich, Switzerland.
Publikováno v:
The Journal of chemical physics [J Chem Phys] 2022 Jan 28; Vol. 156 (4), pp. 044203.
Autor:
Gadelha AC; Physics Department, Universidade Federal de Minas Gerais, Belo Horizonte, MG 31270-901, Brazil.; Department of Physics, Department of Chemistry, and JILA, University of Colorado at Boulder, Boulder, Colorado 80309, United States., Vasconcelos TL; Instituto Nacional de Metrologia, Qualidade e Tecnologia (Inmetro), Duque de Caxias, RJ 25250-020, Brazil., Cançado LG; Physics Department, Universidade Federal de Minas Gerais, Belo Horizonte, MG 31270-901, Brazil., Jorio A; Physics Department, Universidade Federal de Minas Gerais, Belo Horizonte, MG 31270-901, Brazil.; Electrical Engineering Graduate Program, Universidade Federal de Minas Gerais, Belo Horizonte, MG 31270-901, Brazil.
Publikováno v:
The journal of physical chemistry letters [J Phys Chem Lett] 2021 Aug 12; Vol. 12 (31), pp. 7625-7631. Date of Electronic Publication: 2021 Aug 05.
Autor:
Tschannen CD; Photonics Laboratory, ETH Zürich, 8093 Zürich, Switzerland., Frimmer M; Photonics Laboratory, ETH Zürich, 8093 Zürich, Switzerland., Gordeev G; Department of Physics, Freie Universität Berlin, 14195 Berlin, Germany., Vasconcelos TL; Materials Metrology Division, Instituto Nacional de Metrologia Qualidade e Tecnologia (INMETRO), 25250-020 Duque de Caxias, RJ, Brazil., Shi L; School of Materials Science and Engineering, State Key Laboratory of Optoelectronic Materials and Technologies, Nanotechnology Research Center, Guangzhou Key Laboratory of Flexible Electronic Materials and Wearable Devices, Sun Yat-sen University, Guangzhou 510275, P. R. China., Pichler T; Faculty of Physics, Universität Wien, 1090 Wien, Austria., Reich S; Department of Physics, Freie Universität Berlin, 14195 Berlin, Germany., Heeg S; Department of Physics, Freie Universität Berlin, 14195 Berlin, Germany.; Department of Physics, Humboldt Universität zu Berlin, 12489 Berlin, Germany., Novotny L; Photonics Laboratory, ETH Zürich, 8093 Zürich, Switzerland.
Publikováno v:
ACS nano [ACS Nano] 2021 Jul 27; Vol. 15 (7), pp. 12249-12255. Date of Electronic Publication: 2021 Jul 13.
Autor:
Gadelha AC; Physics Department, Universidade Federal de Minas Gerais, Belo Horizonte, Brazil., Ohlberg DAA; Physics Department, Universidade Federal de Minas Gerais, Belo Horizonte, Brazil., Rabelo C; Electrical Engineering Graduate Program, Universidade Federal de Minas Gerais, Belo Horizonte, Brazil., Neto EGS; Physics Institute, Universidade Federal da Bahia, Campus Universitário de Ondina, Salvador, Brazil., Vasconcelos TL; Divisão de Metrologia de Materiais, Inmetro, Duque de Caxias, Brazil., Campos JL; Physics Department, Universidade Federal de Minas Gerais, Belo Horizonte, Brazil., Lemos JS; Physics Department, Universidade Federal de Minas Gerais, Belo Horizonte, Brazil., Ornelas V; Physics Department, Universidade Federal de Minas Gerais, Belo Horizonte, Brazil., Miranda D; Physics Department, Universidade Federal de Minas Gerais, Belo Horizonte, Brazil., Nadas R; Physics Department, Universidade Federal de Minas Gerais, Belo Horizonte, Brazil., Santana FC; Physics Department, Universidade Federal de Minas Gerais, Belo Horizonte, Brazil., Watanabe K; National Institute for Materials Science, Ibaraki, Japan., Taniguchi T; National Institute for Materials Science, Ibaraki, Japan., van Troeye B; Department of Physics, Applied Physics, and Astronomy, Jonsson Rowland Science Center, Troy, NY, USA., Lamparski M; Department of Physics, Applied Physics, and Astronomy, Jonsson Rowland Science Center, Troy, NY, USA., Meunier V; Department of Physics, Applied Physics, and Astronomy, Jonsson Rowland Science Center, Troy, NY, USA. meuniv@rpi.edu., Nguyen VH; Institute of Condensed Matter and Nanosciences, Université Catholique de Louvain, Louvain-la-Neuve, Belgium., Paszko D; Institute of Condensed Matter and Nanosciences, Université Catholique de Louvain, Louvain-la-Neuve, Belgium., Charlier JC; Institute of Condensed Matter and Nanosciences, Université Catholique de Louvain, Louvain-la-Neuve, Belgium., Campos LC; Physics Department, Universidade Federal de Minas Gerais, Belo Horizonte, Brazil., Cançado LG; Physics Department, Universidade Federal de Minas Gerais, Belo Horizonte, Brazil., Medeiros-Ribeiro G; Computer Science Department, Universidade Federal de Minas Gerais, Belo Horizonte, Brazil., Jorio A; Physics Department, Universidade Federal de Minas Gerais, Belo Horizonte, Brazil. adojorio@fisica.ufmg.br.; Electrical Engineering Graduate Program, Universidade Federal de Minas Gerais, Belo Horizonte, Brazil. adojorio@fisica.ufmg.br.
Publikováno v:
Nature [Nature] 2021 Feb; Vol. 590 (7846), pp. 405-409. Date of Electronic Publication: 2021 Feb 17.
Autor:
de O Pereira ML; Instituto de Química, Universidade Federal do Rio de Janeiro (UFRJ), 21941-909, Rio de Janeiro, Brasil. dgrasseschi@iq.ufrj.br., de Souza Paiva R, Vasconcelos TL, Oliveira AG, Oliveira Salles M, Toma HE, Grasseschi D
Publikováno v:
Dalton transactions (Cambridge, England : 2003) [Dalton Trans] 2020 Nov 25; Vol. 49 (45), pp. 16296-16304.