Zobrazeno 1 - 10
of 280
pro vyhledávání: '"Vandemaele, P"'
Autor:
Eales, Oliver, Plank, Michael J., Cowling, Benjamin J., Howden, Benjamin P., Kucharski, Adam J., Sullivan, Sheena G., Vandemaele, Katelijn, Viboud, Cecile, Riley, Steven, McCaw, James M., Shearer, Freya M.
To support the ongoing management of viral respiratory diseases, many countries are moving towards an integrated model of surveillance for SARS-CoV-2, influenza, and other respiratory pathogens. While many surveillance approaches catalysed by the COV
Externí odkaz:
http://arxiv.org/abs/2306.01224
Autor:
Oliver Eales, Michael J. Plank, Benjamin J. Cowling, Benjamin P. Howden, Adam J. Kucharski, Sheena G. Sullivan, Katelijn Vandemaele, Cecile Viboud, Steven Riley, James M. McCaw, Freya M. Shearer
Publikováno v:
Emerging Infectious Diseases, Vol 30, Iss 2, Pp 1-9 (2024)
To support the ongoing management of viral respiratory diseases while transitioning out of the acute phase of the COVID-19 pandemic, many countries are moving toward an integrated model of surveillance for SARS-CoV-2, influenza virus, and other respi
Externí odkaz:
https://doaj.org/article/319a30ee0b1248fd8ac88bcf0d7a88ba
Autor:
Yasmine Khan, Nick Verhaeghe, Robby De Pauw, Brecht Devleesschauwer, Sylvie Gadeyne, Vanessa Gorasso, Yolande Lievens, Niko Speybroeck, Nancy Van Damme, Miet Vandemaele, Laura Van den Borre, Sophie Vandepitte, Katrien Vanthomme, Freija Verdoodt, Delphine De Smedt
Publikováno v:
PLoS ONE, Vol 19, Iss 6, p e0306495 (2024)
[This corrects the article DOI: 10.1371/journal.pone.0288777.].
Externí odkaz:
https://doaj.org/article/5e0b4f54a1854fc3b5a07c8f9e265dbc
Akademický článek
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Autor:
Patricia Clement, Marco Castellaro, Thomas W. Okell, David L. Thomas, Pieter Vandemaele, Sara Elgayar, Aaron Oliver-Taylor, Thomas Kirk, Joseph G. Woods, Sjoerd B. Vos, Joost P. A. Kuijer, Eric Achten, Matthias J. P. van Osch, BIDS maintainers, John A. Detre, Hanzhang Lu, David C. Alsop, Michael A. Chappell, Luis Hernandez-Garcia, Jan Petr, Henk J. M. M. Mutsaerts
Publikováno v:
Scientific Data, Vol 9, Iss 1, Pp 1-8 (2022)
Abstract Arterial spin labeling (ASL) is a non-invasive MRI technique that allows for quantitative measurement of cerebral perfusion. Incomplete or inaccurate reporting of acquisition parameters complicates quantification, analysis, and sharing of AS
Externí odkaz:
https://doaj.org/article/fd675eefaa1b44d0a5b95859e3677d36
Publikováno v:
IEEE Electron Device Letters, vol. 39, no. 2, pp. 268-271, Jan. 2018
Ru has been considered a candidate to replace Cu-based interconnects in VLSI circuits. Here, a methodology is proposed to predict the resistivity of (Ru) interconnects. First, the dependence of the Ru thin film resistivity on the film thickness is mo
Externí odkaz:
http://arxiv.org/abs/1712.03859
Autor:
Stanislav Tyaginov, Erik Bury, Alexander Grill, Zhuoqing Yu, Alexander Makarov, An De Keersgieter, Mikhail Vexler, Michiel Vandemaele, Runsheng Wang, Alessio Spessot, Adrian Chasin, Ben Kaczer
Publikováno v:
Micromachines, Vol 14, Iss 11, p 2018 (2023)
We develop a compact physics model for hot-carrier degradation (HCD) that is valid over a wide range of gate and drain voltages (Vgs and Vds, respectively). Special attention is paid to the contribution of secondary carriers (generated by impact ioni
Externí odkaz:
https://doaj.org/article/a89ea25261ac49ac9cd9be88b909e5f2
Autor:
Yasmine Khan, Nick Verhaeghe, Robby De Pauw, Brecht Devleesschauwer, Sylvie Gadeyne, Vanessa Gorasso, Yolande Lievens, Niko Speybroek, Nancy Vandamme, Miet Vandemaele, Laura Van den Borre, Sophie Vandepitte, Katrien Vanthomme, Freija Verdoodt, Delphine De Smedt
Publikováno v:
PLoS ONE, Vol 18, Iss 10, p e0288777 (2023)
IntroductionCancer causes a substantial burden to our society, both from a health and an economic perspective. To improve cancer patient outcomes and lower society expenses, early diagnosis and timely treatment are essential. The recent COVID-19 cris
Externí odkaz:
https://doaj.org/article/6ae7c383b1af41bdbe8018fa187770d2
Akademický článek
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Autor:
Stanislav Tyaginov, Barry O’Sullivan, Adrian Chasin, Yaksh Rawal, Thomas Chiarella, Camila Toledo de Carvalho Cavalcante, Yosuke Kimura, Michiel Vandemaele, Romain Ritzenthaler, Jerome Mitard, Senthil Vadakupudhu Palayam, Jason Reifsnider, Ben Kaczer
Publikováno v:
Micromachines, Vol 14, Iss 8, p 1514 (2023)
We study how nitridation, applied to SiON gate layers, impacts the reliability of planar metal-oxide-semiconductor field effect transistors (MOSFETs) subjected to negative and positive bias temperature instability (N/PBTI) as well as hard breakdown (
Externí odkaz:
https://doaj.org/article/159b72733fdd4cceaa85f3f66d7c71b7