Zobrazeno 1 - 7
of 7
pro vyhledávání: '"Van Woudenberg, Jasper"'
Autor:
Kiaei, Pantea, Yao, Yuan, Liu, Zhenyuan, Fern, Nicole, Breunesse, Cees-Bart, Van Woudenberg, Jasper, Gillis, Kate, Dich, Alex, Grossmann, Peter, Schaumont, Patrick
While side-channel leakage is traditionally evaluated from a fabricated chip, it is more time-efficient and cost-effective to do so during the design phase of the chip. We present a methodology to rank the gates of a design according to their contrib
Externí odkaz:
http://arxiv.org/abs/2204.11972
Autor:
Kiaei, Pantea, Breunesse, Cees-Bart, Ahmadi, Mohsen, Schaumont, Patrick, van Woudenberg, Jasper
Fault injection attacks can cause errors in software for malicious purposes. Oftentimes, vulnerable points of a program are detected after its development. It is therefore critical for the user of the program to be able to apply last-minute security
Externí odkaz:
http://arxiv.org/abs/2011.14067
Akademický článek
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Autor:
van Woudenberg, Jasper, Breunesse, Cees-Bart, Velegalati, Rajesh, Yalla, Panasayya, Gonzalez, Sergio
Publikováno v:
ACM International Conference Proceeding Series; 12/5/2017, p1-9, 9p
Publikováno v:
Topics in Cryptology - CT-RSA 2012; 2012, p383-397, 15p
Publikováno v:
Topics in Cryptology - Ct-rsa 2011; 2011, p104-119, 16p
Publikováno v:
Topics in Cryptology - Ct-rsa 2011; 2011, p77-88, 12p