Protection of a 3.3V domain and switchable 1.8V/3.3V I/O in a 40nm pure 1.8V process.

Autor: Van der Borght, J., Van Wijmeersch, S., Serneels, B., Goodings, C.

Publikováno v: 2011 33rd NO POD PERMISSION Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD); 2011, p1-6, 6p