Zobrazeno 1 - 10
of 313
pro vyhledávání: '"Van Aert Sandra"'
Autor:
De Meyer Robin, Grünewald Lukas, Chezganov Dmitry, Orekhov Andrey, Van Aert Sandra, Bogaerts Annemie, Bals Sara, Verbeeck Jo
Publikováno v:
BIO Web of Conferences, Vol 129, p 08007 (2024)
Externí odkaz:
https://doaj.org/article/a442face593546b4b2f83a9f9033b8b0
Autor:
De Backer Annick, Zhang Zezhong, Sánchez-Iglesias Ana, Liz-Marzán Luis M., Nellist Peter D., Bals Sara, Şentürk Duygu G., Hao Yansong, Findlay Scott, Van Aert Sandra
Publikováno v:
BIO Web of Conferences, Vol 129, p 06024 (2024)
Externí odkaz:
https://doaj.org/article/edda007d8a2140908f2dd62f784f792e
Publikováno v:
BIO Web of Conferences, Vol 129, p 02007 (2024)
Externí odkaz:
https://doaj.org/article/c75196a207ee43cd8af7da4742ad59b4
Autor:
Schrenker Nadine, Braeckevelt Tom, De Backer Annick, Livakas Nikolaos, Yu Chu-Ping, Friedrich Thomas, Jannis Daen, Béché Armand, Roeffaers Maarten, Hofkens Johan, Verbeeck Johan, Manna Liberato, Van Speybroeck Veronique, Van Aert Sandra, Bals Sara
Publikováno v:
BIO Web of Conferences, Vol 129, p 24008 (2024)
Externí odkaz:
https://doaj.org/article/d6b941609b4d490ca886c4c837d3a394
By working out the Bethe sum rule, a boundary condition that takes the form of a linear equality is derived for the fine structure observed in ionization edges present in electron energy-loss spectra. This condition is subsequently used as a constrai
Externí odkaz:
http://arxiv.org/abs/2408.11870
Through a simulation-based study we develop a statistical model-based quantification method for atomic resolution first moment scanning transmission electron microscopy (STEM) images. This method uses the uniformly weighted least squares estimator to
Externí odkaz:
http://arxiv.org/abs/2408.02405
Autor:
Zhang, Zezhong, Lobato, Ivan, Brown, Hamish, Lamoen, Dirk, Jannis, Daen, Verbeeck, Johan, Van Aert, Sandra, Nellist, Peter D.
The rich information of electron energy-loss spectroscopy (EELS) comes from the complex inelastic scattering process whereby fast electrons transfer energy and momentum to atoms, exciting bound electrons from their ground states to higher unoccupied
Externí odkaz:
http://arxiv.org/abs/2405.10151
Autor:
Grünewald, Lukas, Chezganov, Dmitry, De Meyer, Robin, Orekhov, Andrey, Van Aert, Sandra, Bogaerts, Annemie, Bals, Sara, Verbeeck, Jo
Microplasmas can be used for a wide range of technological applications and to improve our understanding of fundamental physics. Scanning electron microscopy, on the other hand, provides insights into the sample morphology and chemistry of materials
Externí odkaz:
http://arxiv.org/abs/2308.15123
Advanced materials often consist of multiple elements which are arranged in a complicated structure. Quantitative scanning transmission electron microscopy is useful to determine the composition and thickness of nanostructures at the atomic scale. Ho
Externí odkaz:
http://arxiv.org/abs/2209.07950
Publikováno v:
In Ultramicroscopy January 2025 268