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pro vyhledávání: '"Van Aert S"'
State-of-the-art electron microscopes such as scanning electron microscopes (SEM), scanning transmission electron microscopes (STEM) and transmission electron microscopes (TEM) have become increasingly sophisticated. However, the quality of experimen
Externí odkaz:
http://arxiv.org/abs/2303.17025
Autor:
van Thiel, T. C., Brzezicki, W., Autieri, C., Hortensius, J. R., Afanasiev, D., Gauquelin, N., Jannis, D., Janssen, N., Groenendijk, D. J., Fatermans, J., van Aert, S., Verbeeck, J., Cuoco, M., Caviglia, A. D.
Publikováno v:
Phys. Rev. Lett. 127, 127202 (2021)
In oxide heterostructures, different materials are integrated into a single artificial crystal, resulting in a breaking of inversion-symmetry across the heterointerfaces. A notable example is the interface between polar and non-polar materials, where
Externí odkaz:
http://arxiv.org/abs/2107.03359
Publikováno v:
In Ultramicroscopy May 2024 259
Publikováno v:
In Ultramicroscopy January 2024 255
Publikováno v:
In Ultramicroscopy September 2023 251
Recently, the maximum a posteriori (MAP) probability rule has been proposed as an objective and quantitative method to detect atom columns and even single atoms from high-resolution high-angle annular dark-field (HAADF) scanning transmission electron
Externí odkaz:
http://arxiv.org/abs/1902.05809
The atomic lensing model has been proposed as a promising method facilitating atom-counting in heterogeneous nanocrystals [KHW van den Bos et. al, Phys. Rev. Lett. 116 (2016) 246101] Here, image simulations will validate the model, which describes dy
Externí odkaz:
http://arxiv.org/abs/1902.05806
Publikováno v:
In Ultramicroscopy May 2023 247
Autor:
Groenendijk, D. J., Autieri, C., van Thiel, T. C., Brzezicki, W., Gauquelin, N., Barone, P., Bos, K. H. W. van den, van Aert, S., Verbeeck, J., Filippetti, A., Picozzi, S., Cuoco, M., Caviglia, A. D.
Publikováno v:
Phys. Rev. Research 2, 023404 (2020)
Geometric phases in condensed matter play a central role in topological transport phenomena such as the quantum, spin and anomalous Hall effect (AHE). In contrast to the quantum Hall effect - which is characterized by a topological invariant and robu
Externí odkaz:
http://arxiv.org/abs/1810.05619
Publikováno v:
In Ultramicroscopy December 2022 242