Zobrazeno 1 - 1
of 1
pro vyhledávání: '"Valeriy Y. Yashchuk"'
Autor:
Péter Takács, Valeriy Y. Yashchuk, Samuel K. Barber, Eugene L. Church, Konstantine Kaznatcheev, Wayne R. McKinney
Publikováno v:
International Optical Design Conference and Optical Fabrication and Testing.
The frequency footprint of ID and 2D profiling instruments needs to be carefully considered in comparing ID surface roughness spectrum measurements made by different instruments. Contributions from orthogonal direction frequency components can not be