Zobrazeno 1 - 7
of 7
pro vyhledávání: '"Valentina Giliberto"'
Autor:
Giovanna Mura, Marco Barbato, Alessandro Compagnin, Matteo Meneghini, Valentina Giliberto, Andrea Cester, Enrico Zanoni, Gaudenzio Meneghesso, Massimo Vanzi
Publikováno v:
Microelectronics Reliability. 53:1809-1813
This work presents a detailed analysis of the degradation of Si-based solar cells submitted to reverse-bias stress; the study is based on electrical, electro-optical and thermal measurements, carried out at the different stages of the stress tests. T
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::3b3de5a24f20ad21064b7f2b8d5217f4
https://doi.org/10.1016/j.microrel.2013.07.013
https://doi.org/10.1016/j.microrel.2013.07.013
This paper shows the potentialities of two characterization procedures on the electrical and mechanical characterizations of ohmic RF microelectromechanical systems (MEMS) switches. The first is a “fast electrical” procedure that uses an electric
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::fda0023ca6907ec85cbd8728bf0f1ad0
http://hdl.handle.net/11577/3065520
http://hdl.handle.net/11577/3065520
Autor:
Alessandro Compagnin, Matteo Meneghini, M. Marsili, Marco Barbato, Gaudenzio Meneghesso, Enrico Zanoni, Valentina Giliberto, Andrea Cester
Publikováno v:
2013 IEEE 39th Photovoltaic Specialists Conference (PVSC).
With this paper we present an extensive analysis of the degradation of Si-based solar cells submitted to reverse-bias stress. The study was carried out by combined electrical, electro-optical and thermal measurements, executed at the different stages
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4beb761cee150d1b7d9955e433cec8f3
https://doi.org/10.1109/pvsc.2013.6744497
https://doi.org/10.1109/pvsc.2013.6744497
In this work we present a new measurement set up able to predict the lifetime of packaged ohmic RF MEMS submitted to long actuation periods. Experimental results were carried out for a relatively long time period in order to verify the degradation la
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::1eb5923d0cff04640e32cb903e95c164
http://hdl.handle.net/11577/2693099
http://hdl.handle.net/11577/2693099
Autor:
Daniele Giaffreda, Marco Barbato, Gaudenzio Meneghesso, Claudio Fiegna, Matteo Meneghini, Valentina Giliberto, Paolo Magnone, R. De Rose
Publikováno v:
2012 38th IEEE Photovoltaic Specialists Conference.
In this paper we discuss the effect of shunt resistance on the electro-optical characteristics of multicrystalline silicon (mc-Si) solar cells at different illumination levels. The analysis is based on combined electro-optical characterization and th
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::2184a301b61e875061c9e333a2a61420
https://doi.org/10.1109/pvsc.2012.6317827
https://doi.org/10.1109/pvsc.2012.6317827
Publikováno v:
Politecnico di Torino-IRIS
The contact problem in microstructures with electrostatic actuation is the topic of this study. High impact velocity between the electrodes is responsible for surfaces damaging and initiation of failure mechanisms. An open-loop strategy to reduce the
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::dcca613dfb3151ce000e8f0a833f8df2
http://hdl.handle.net/11583/2505544
http://hdl.handle.net/11583/2505544
Autor:
Benno Margesin, A. Massenz, Valentina Giliberto, Marco Barbato, S. Colpo, Gaudenzio Meneghesso
We propose and discuss a detailed reliability investigation of ohmic RF-MEMS switches, affected by high charge trapping phenomena, and we analyse how these test methods affect the study of charge trapping issues. We investigate the effect of three di
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f9ae1e851c3cd1a73f76c69a7b5d5140
http://hdl.handle.net/11577/2477771
http://hdl.handle.net/11577/2477771