Zobrazeno 1 - 5
of 5
pro vyhledávání: '"Valentin Stoytschew"'
Publikováno v:
Microchemical Journal. 139:155-163
The photostability of red synthetic organic pigments of three different chemical classes such as naphthol AS (PR112), diketopyrrolopyrrole (PR254 and 255), and quinacridone (PR122 and red shaded PV19) is investigated in the present work. In particula
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::97a7469459ed122a478b3d5636c854c4
https://doi.org/10.1016/j.microc.2018.02.029
https://doi.org/10.1016/j.microc.2018.02.029
Autor:
Nikola Marković, Ivančica Bogdanović Radović, Zdravko Siketić, Valentin Stoytschew, Dubravka Jembrih-Simbürger, Milko Jakšić, Marta Anghelone
Publikováno v:
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
Secondary Ion Mass Spectrometry using MeV ion excitation was applied to analyse modern paint materials containing synthetic organic pigments and binders. It was demonstrated that synthetic organic pigments and binder components with molecular masses
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::7af1ac253cd6c8db72bfebc034b9c998
https://doi.org/10.1016/j.nimb.2017.01.007
https://doi.org/10.1016/j.nimb.2017.01.007
Megaelectronvolt-Secondary Ion Mass Spectrometry (MeV-SIMS) is an emerging ion beam analysis technique for molecular speciation and submicrometer imaging. Following the construction of different experimental setups a systematic investigation on the d
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::96cffcb0330d20fe444b83f18f4ace68
https://doi.org/10.1016/j.nimb.2017.01.022
https://doi.org/10.1016/j.nimb.2017.01.022
Autor:
Iva Bogdanović Radović, Julien Demarche, Zdravko Siketić, Milko Jakšić, Valentin Stoytschew, Lidija Matjacic, Roger P. Webb
Megaelectronvolt-Secondary Ion Mass Spectrometry (MeV-SIMS) is an emerging Ion Beam Analysis technique for molecular speciation and submicron imaging. Various setups have been constructed in the recent years. Still a systematic investigation on the d
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::0b2c8bb1a33b94642273500d5e90c260
https://www.bib.irb.hr/801727
https://www.bib.irb.hr/801727
Autor:
Christian Seim, Wolfgang Malzer, Ioanna Mantouvalou, Valentin Stoytschew, Birgit Kanngiesser, Timo de Wolff
Publikováno v:
Analytical chemistry. 86(19)
Depth profiling with confocal micro-X-ray fluorescence spectroscopy (confocal micro-XRF) is a nondestructive analytical method for obtaining elemental depth profiles in the micrometer region. Up until now, the quantitative reconstruction of thickness
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::affc42af55670ca57e9c11ef34ceeb95
https://pubmed.ncbi.nlm.nih.gov/25162502
https://pubmed.ncbi.nlm.nih.gov/25162502