Zobrazeno 1 - 4
of 4
pro vyhledávání: '"Valentin Genuer"'
Publikováno v:
OSA Optical Design and Fabrication 2021 (Flat Optics, Freeform, IODC, OFT).
Wavefront sensor based on Quadriwave Lateral Shearing Interferometry is used to fully characterize flat optics and metasurfaces. It measures both the global optical function (phase shaping, MTF, PSF, …) but also the metastructure arrangement. © 20
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::dd31488b4ca1c3f30bd0b944bcc6e019
https://doi.org/10.1364/flatoptics.2021.jtu1a.15
https://doi.org/10.1364/flatoptics.2021.jtu1a.15
Publikováno v:
Frontiers in Optics / Laser Science.
Quantitative phase imaging (QPI) solutions are developed to characterize metasurfaces in single-shot. SID4 wavefront sensor based on Quadriwave Lateral Shearing Interferometry (QWLSI), is used to provide the quantitative phase information such as wav
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::62dbd89ff520f977fc503f04ebf5db77
https://doi.org/10.1364/fio.2020.fw5f.1
https://doi.org/10.1364/fio.2020.fw5f.1
Publikováno v:
Astronomical Optics: Design, Manufacture, and Test of Space and Ground Systems II.
We present an optical metrology instrument for measuring both transmitted and reflected wavefront error (TWE and RWE) of coated or uncoated optics over a diameter of 5 inches. Depending on the coating transmittance and reflectance, the measurements h
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::05069909eb6092ed61995c618c3084f9
https://doi.org/10.1117/12.2528871
https://doi.org/10.1117/12.2528871
Autor:
Pierre Marcoux, Emmanuelle Schultz, Jérémy Méteau, Jean-Marc Dinten, Max Maurin, Valentin Genuer, O. Gal, Eric Lacot
Publikováno v:
Spie (Society of Photo-Optical Instrumentation Engineers)
SPIE BiOS-Advanced Biomedical and Clinical Diagnostic and Surgical Guidance Systems
SPIE BiOS-Advanced Biomedical and Clinical Diagnostic and Surgical Guidance Systems, Feb 2016, san francisco, United States. pp.96980-96981, ⟨10.1117/12.2211021⟩
SPIE BiOS-Advanced Biomedical and Clinical Diagnostic and Surgical Guidance Systems
SPIE BiOS-Advanced Biomedical and Clinical Diagnostic and Surgical Guidance Systems, Feb 2016, san francisco, United States. pp.96980-96981, ⟨10.1117/12.2211021⟩
Full paper also available on https://arxiv.org/abs/1610.02980; International audience; We report here on the ability of elastic light scattering in discriminating Gram+, Gram-and yeasts at an early stage of growth (6h). Our technique is non-invasive,
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::c700c74c8624b1bff8b31cea5123ec62
https://hal.archives-ouvertes.fr/hal-01374265
https://hal.archives-ouvertes.fr/hal-01374265
