Výsledky vyhledávání - "Vaishali Batra"

Comparison of Electrical Properties of Pb0.95La0.05Zr0.54Ti0.46O3 Thin Film Capacitors Using Coplanar and Interplanar Electrode Configuration

Autor: Vaishali Batra, Sushma Kotru

Publikováno v: Journal of Nanoscience and Nanotechnology. 19:5949-5953

Metal/ferroelectric/metal capacitors were fabricated using ferroelectric thin films of Pb0.95La0.05Zr0.54Ti0.46O₃. Pb0.95La0.05Zr0.54Ti0.46O₃ films were deposited on Pt/Si substrate using chemical solution deposition method and Au metal electrode

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::c900d61e7197c97a7a1e28217d6c9291
https://doi.org/10.1166/jnn.2019.16930

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A simulation model for PLZT based ferroelectric photovoltaic devices, II. Influence on charge transport and photovoltaic parameters with ITO top and Pt bottom electrodes

Autor: Vaishali Batra, Sushma Kotru

Publikováno v: Ferroelectrics. 536:132-145

This work is an extension of our previously developed photovoltaic (PV) model with ferroelectric PLZT as photoactive layer, metal Pt as top and bottom electrodes. Pt electrodes result in good ferro...

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::1e7b86de1c662d5a16cf0bda7e2549c7
https://doi.org/10.1080/00150193.2018.1528936

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A simulation model for understanding the charge transport and recombination behavior in PLZT based ferroelectric photovoltaic devices

Autor: Sushma Kotru, Vaishali Batra

Publikováno v: Ferroelectrics. 532:121-137

We present a simulation model for ferroelectric lanthanum doped lead zirconate titanate thin film based photovoltaic devices using a semiconducting thin-film optics simulation (SETFOS) software. Th...

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::2e39e4707121b39db2111ff675298efb
https://doi.org/10.1080/00150193.2018.1430433

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{100}-textured piezoelectric Pb(Zr,Ti)O3 films: Influence of Pb content in the PbxTiO3 seed layer on the electrical properties of chemical solution deposited Pb(Zr,Ti)O3

Autor: Vaishali Batra, Sushma Kotru, Jian Zhong

Publikováno v: Journal of Vacuum Science & Technology A. 39:043405

In this work, the influence of Pb content (x = 1.0, 1.05, 1.1, and 1.2) in a 0.02M PbxTiO3 (PxT) seed layer on {100}-texture percentage and electrical properties of Pb1.1(Zr0.52,Ti0.48)O3 (PZT) films was investigated. The 0.02M concentration of the P

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::e8ca5691a0e997c90f23fa4623094f1a
https://doi.org/10.1116/6.0000955

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Annealing-induced changes in chemical bonding and surface characteristics of chemical solution deposited Pb0.95La0.05Zr0.54Ti0.46O3 thin films

Autor: Vaishali Batra, Sushma Kotru, Chintalapalle V. Ramana

Publikováno v: Applied Surface Science. 379:191-198

We report the effect of post deposition annealing temperature (Ta = 550 and 750 °C) on the surface morphology, chemical bonding and structural development of lanthanum doped lead zirconate titanate (Pb0.95La0.05Zr0.54Ti0.46O3; referred to PLZT) thin

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::f1182e9e656f423705c22f502624f4e6
https://doi.org/10.1016/j.apsusc.2016.03.152

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Optical constants and band gap determination of Pb0.95La0.05Zr0.54Ti0.46O3 thin films using spectroscopic ellipsometry and UV–visible spectroscopy

Autor: Vaishali Batra, M. Varagas, Chintalapalle V. Ramana, Sushma Kotru

Publikováno v: Optical Materials. 49:123-128

We report the structural evolution and optical properties of lanthanum doped lead zirconate titanate (PLZT) thin films prepared on Pt/TiO 2 /SiO 2 /Si substrates by chemical solution deposition. X-ray diffraction demonstrates the post-deposition anne

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::6eb2eb5682008df33dbe2d9d1f0f6e44
https://doi.org/10.1016/j.optmat.2015.08.019

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Temperature-controlled-orientation dependence of electrical properties of Pb0.95La0.05Zr0.46Ti0.54O3 thin films

Autor: Sushma Kotru, Vaishali Batra

Publikováno v: Journal of Vacuum Science & Technology B. 36:052908

In this work, the relationship between annealing temperature, crystallographic orientation, and electrical properties of Pb0.95La0.05Zr0.54Ti0.46O3 thin films was investigated. The films (∼210 nm) were prepared using a chemical solution deposition

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::32990eac15fccdc52f8a372717e9bc07
https://doi.org/10.1116/1.5041382

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Electrical behavior of Pb0.95La0.05Zr0.54Ti0.46O3 thin film based capacitors: Influence of space charge region

Autor: Vaishali Batra, Sushma Kotru, V. N. Harshan

Publikováno v: Journal of Applied Physics. 124:034101

We investigated the influence of space charge region (SCR) on the electrical properties of Pb0.95La0.05Zr0.54Ti0.46O3 (PLZT) thin film based capacitor structures. The metal/PLZT/Pt capacitors were prepared by using metal electrodes (Pt, Au, Al) of va

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::19cd7306dcdf051a4eac39f0430d8487
https://doi.org/10.1063/1.5031457

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