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pro vyhledávání: '"Vainio, Hannu"'
peer-reviewed In this paper we present how functional defect analysis can be applied for software process improvement (SPI) purposes. Software defect data is shown to be one of the most important available management information sources for SPI decis
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od______1249::a8eb844e3b8158acfe54fbb9a42c5853
Publikováno v:
Systems, Software & Services Process Improvement (9783642391781); 2013, p72-83, 12p
Publikováno v:
Product-Focused Software Process Improvement (9783642310621); 2012, p3-16, 14p
Autor:
Montoya Perez, Ileana, Jambor, Ivan, Pahikkala, Tapio, Airola, Antti, Merisaari, Harri, Saunavaara, Jani, Alinezhad, Saeid, Väänänen, Riina‐Minna, Tallgrén, Terhi, Verho, Janne, Kiviniemi, Aida, Ettala, Otto, Knaapila, Juha, Syvänen, Kari T., Kallajoki, Markku, Vainio, Paula, Aronen, Hannu J., Pettersson, Kim, Boström, Peter J., Taimen, Pekka
Publikováno v:
Journal of Magnetic Resonance Imaging; May2020, Vol. 51 Issue 5, p1540-1553, 14p
Publikováno v:
2015 IEEE International Geoscience & Remote Sensing Symposium (IGARSS); 2015, p1340-1343, 4p
Publikováno v:
Proceedings Euro ASIC '90; 1990, p56-61, 6p
Autor:
Bessette, B., Salami, R., Lefebvre, R., Jelinek, M., Rotola-Pukkila, J., Vainio, J., Mikkola, H., Jarvinen, K.
Publikováno v:
IEEE Transactions on Speech & Audio Processing; Nov2002, Vol. 10 Issue 8, p620-636, 17p
Publikováno v:
Scandinavian Journal of Thoracic & Cardiovascular Surgery; 1995, Vol. 29 Issue 1, p7-10, 4p
Publikováno v:
Proceedings of IEEE Vehicular Technology Conference (VTC); 1994, p462-462, 1p