Zobrazeno 1 - 10
of 19
pro vyhledávání: '"V.V. Shynkarenko"'
Autor:
V.V. Shynkarenko
Publikováno v:
Innovate Pedagogy. 1:193-196
Publikováno v:
Innovate Pedagogy. 2:98-101
Autor:
S.M. Red’ko, V.B. Neymash, R. A. Red’ko, G.V. Milenin, V. V. Shvalagin, O.S. Kondratenko, V.V. Shynkarenko, V.Y. Povarchuk
Publikováno v:
Materials Chemistry and Physics. 267:124669
The effect of electron irradiation on the evolution of photoluminescence and optical properties of Si-doped GaN was investigated. MOCVD grown GaN thin films were irradiated with 4 MeV electrons at different doses of 1·107, 2.5·107 and 1·108 rad. I
Publikováno v:
Фізика і хімія твердого тіла, Vol 18, Iss 2, Pp 173-179 (2018)
The results of a complex study of C60/Si heterosystems are presented in this work: the crystal structure and composition of the films, internal mechanical stresses, electronic parameters of the film and the film-substrate interface, and the effect of
Autor:
V. S. Slipokurov, A. V. Zorenko, A. V. Sachenko, A. S. Slepova, A. V. Bobyl, V.V. Shynkarenko, V. P. Kladko, Alexander Belyaev, I.N. Arsentiev, R. V. Konakova, N. V. Safryuk, V. M. Kovtonyuk, Ya. Ya. Kudryk, N. S. Boltovets, A. I. Gudymenko
Publikováno v:
Semiconductor Physics Quantum Electronics and Optoelectronics. 18:317-323
Experimental data on manufacturing the ohmic contacts Au–Ti–Pd–n⁺-InP, formed using vacuum deposition of metal onto a heated to 300 °C substrate representing an epitaxial n⁺-n-n⁺⁺-n⁺⁺⁺-InP structure. The specific contact resistan
Autor:
V.V. Shynkarenko
Publikováno v:
2012 28th International Conference on Microelectronics Proceedings.
Thus, it is shown that short-term microwave irradiation leads to phase modification of the TiB 2 -TiC-C and TiB 2 -B 4 C-C composite materials. As a result, both their composition and microhardness distribution are changed.
Autor:
V. V. Milenin, V.V. Shynkarenko, Boltovets, V.M. Ivanov, V.M. Sheremet, Ya. Ya. Kudryk, Yu. N. Sveshnikov, R. V. Konakova, B.S. Yavich
We propose multilayer ohmic contacts to n- and p-GaN layers, with titanium boride as diffusion barrier. It is shown that the optimal method of contact resistivity measurement is the transmission line method (TLM) with circular contact geometry. The T
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::a2b492372dcb27d40a7afc809e43ced8
http://dspace.nbuv.gov.ua/handle/123456789/118559
http://dspace.nbuv.gov.ua/handle/123456789/118559
Autor:
V.F. Mitin, J. Koprinarova, L. A. Matveeva, V. V. Milenin, E. Yu. Kolyadina, N. S. Boltovets, R. V. Konakova, D.I. Voitsikhovskyi, Elena Atanassova, V.V. Shynkarenko
Publikováno v:
2002 23rd International Conference on Microelectronics. Proceedings (Cat. No.02TH8595).
We present the results of comprehensive investigations of the effects of ordering enhanced by magnetron microwave radiation (frequency of 2.45 GHz, irradiance of 1.5 W/cm/sup 2/, and processing duration of 10 s) in Ta/sub 2/O/sub 5/-p-Si heterosystem
Akademický článek
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Akademický článek
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