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Publikováno v:
1997 IEEE Radiation Effects Data Workshop NSREC Snowmass 1997. Workshop Record Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference.
The detailed dose rate effects investigation of a Radiation Hard Bulk Complementary Metal-Oxide-Semiconductor Read Only Memory (CMOS ROM) family is performed with the "RADON-5E" pulsed laser simulator. The low-impedance probe technique is used to mea
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2ea29b13dc74a35f366009c87859b836
https://doi.org/10.1109/redw.1997.629796
https://doi.org/10.1109/redw.1997.629796
