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The structure study of thin semiconductor and dielectric layers by synchrotron radiation diffraction
Publikováno v:
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. 448:286-289
The structure of novel materials was studied using diffraction patterns obtained at the “Anomalous scattering” station. The substances to be examined are thin (100–9000 A) single-crystals, polycrystals and amorphous thin layers on various kinds
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0d521eabf544d929d3e7e61f73086fc3
https://doi.org/10.1016/s0168-9002(00)00228-x
https://doi.org/10.1016/s0168-9002(00)00228-x
Akademický článek
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Autor:
Islam, Rafiqul
The most important first premise in science is that mass can be neither created nor destroyed. It is also becoming clear that natural laws dictate that mass be connected to energy. In effect, mass-balance provides the only governing equation that is
This book presents current research on reactive oxygen species in joint physiology, including possible mechanism of maintaining hypoxia to protect chondrocytes from oxygen excess via synovial fluid hyaluronan peroxidation; radical degradation of high
Autor:
E . M. Pearce
This book is of interest to the broad audience of scientists and students working in the area of organic chemistry and to engineers and technicians employed in manufacturing.