Zobrazeno 1 - 10
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pro vyhledávání: '"V. Yu. Skobtsov"'
Autor:
V. Yu. Skobtsov, N. V. Lapitskaya
Publikováno v:
Doklady Belorusskogo gosudarstvennogo universiteta informatiki i radioèlektroniki, Vol 19, Iss 8, Pp 72-80 (2022)
The paper presents solutions for estimation and analysis of complex system (CS) reliability and survivability indicators based on the logical-probabilistic approach. Modified logical-probabilistic method and software tool for evaluating the reliabili
Externí odkaz:
https://doaj.org/article/13285f9dd6a04aa8b01b89caaa7c6445
Autor:
V. A. Zelentsov, S. A. Potryasaev, B. V. Sokolov, V. Yu. Skobtsov, S. A. Korenyako, D. S. Kim, E. N. Vakulchyk, L. I. Kulbak, E. D. Nikolaenya, N. V. Lapitskaya, R. V. Saksonov
Publikováno v:
Вестник Самарского университета: Аэрокосмическая техника, технологии и машиностроение, Vol 16, Iss 4, Pp 118-129 (2017)
The paper presents solutions to the problems of estimation, analysis and forecasting of indicators of reliability, survivability and efficiency of on-board equipment (BE) of small satellites (SS) in standard and specified conditions of operation. A d
Externí odkaz:
https://doaj.org/article/7cf6e034c795464bbb9d66b99a179e8b
Autor:
V. Yu. Skobtsov, B.V. Sokolov
Publikováno v:
Вестник ВГУ Серия Системный анализ и информационные технологии. :99-114
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::09208308a46d1a84cc064a364a0ad0cf
https://doi.org/10.17308/sait/1995-5499/2022/3/99-114
https://doi.org/10.17308/sait/1995-5499/2022/3/99-114
Autor:
V. Yu. Skobtsov, Yu. A. Skobtsov
Publikováno v:
EWDTS
In the paper there was considered an application of genetic algorithm to test generation for sequential circuits with using multiple observation time strategy of output signals. Suggested method allows detect the faults, which are undetectable by tra
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1b9e78f4704642368b83673f83f77f29
https://doi.org/10.1109/ewdts.2010.5742104
https://doi.org/10.1109/ewdts.2010.5742104
Autor:
V. Yu. Skobtsov, Yu. A. Skobtsov
Publikováno v:
2007 9th International Conference - The Experience of Designing and Applications of CAD Systems in Microelectronics.
Evolutionary algorithms application in computer aided design VLSI is considered. It is described the application of genetic algorithms to logical circuit test generation. The genetic algorithms for VLSI physical design automation are considered.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::29afd0d271cf034ac35c23b0665a55d1
https://doi.org/10.1109/cadsm.2007.4297613
https://doi.org/10.1109/cadsm.2007.4297613
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Publikováno v:
Cybernetics & Systems Analysis; Jan2022, Vol. 58 Issue 1, p84-94, 11p
Autor:
Kemamalini, A., Seshasayanan, R.
Publikováno v:
2015 International Conference on Innovations in Information, Embedded & Communication Systems (ICIIECS); 2015, p1-6, 6p
Publikováno v:
Radio Electronics, Computer Science, Control; 2015, Vol. 4, p72-78, 7p
Publikováno v:
2013 12th International Conference on the Experience of Designing & Application of CAD Systems in Microelectronics (CADSM); 2013, pIX-XVII, 9p