Zobrazeno 1 - 10
of 33
pro vyhledávání: '"V. Yu Kolosov"'
Autor:
L. Yu. Buldakova, M. Yu. Yanchenko, A. S. Vorokh, A. O. Bokunyaeva, A. A. Yushkov, Elizaveta V. Shalaeva, Marina G. Pervova, Andrei N. Enyashin, N. S. Kozhevnikova, D. A. Zamyatin, Tatyana I. Gorbunova, E.S. Ulyanova, V. Yu. Kolosov
Publikováno v:
Kinetics and Catalysis. 60:325-336
Nanodispersed TiO2 consisting of anatase and brookite phases in a ratio of 3 : 1 is obtained by the sol–gel method from titanium(IV) butoxide at a temperature below 100°C. X-ray diffraction, transmission electron microscopy, and Raman spectroscopy
Autor:
A. A. Yushkov, V. Yu. Kolosov
Publikováno v:
MODERN SYNTHETIC METHODOLOGIES FOR CREATING DRUGS AND FUNCTIONAL MATERIALS (MOSM2020): PROCEEDINGS OF THE IV INTERNATIONAL CONFERENCE.
Nanothin films of bismuth telluride Bi2Te3 were obtained by thermal sputtering in vacuum on a mica substrate with amorphous carbon and a copper sublayer. A sample with a specially created sharp thickness gradient was studied by transmission electron
Autor:
G. B. Kuznetsov, O. M. Zhigalina, K. A. Vorotilov, V. Yu. Kolosov, D. N. Khmelenin, A. S. Sigov, Yu. A. Valieva, A. O. Bokuniaeva
Publikováno v:
Crystallography Reports. 63:646-655
Lead zirconate titanate (PZT) films doped with lanthanum, Pb(1–х)Laх(Zr0.48Ti0.52) (х = 0, 0.02, 0.05, 0.08, or 0.01), have been investigated by electron microscopy and X-ray diffraction. Films were formed on Si–SiO2–TiO2–Pt substrates by
Autor:
V. Yu Kolosov, A. A. Yushkov
Publikováno v:
THE 2ND INTERNATIONAL CONFERENCE ON PHYSICAL INSTRUMENTATION AND ADVANCED MATERIALS 2019.
Thin Bi2Te3 films with a specially created thickness gradient were obtained by thermal deposition in vacuum. The methods of transmission electron microscopy in films revealed crystallographic orientations of the [100] and [2-21] tellurium phases. The
Autor:
V. Yu. Kolosov, C. L. Schwamm
Publikováno v:
AIP Conference Proceedings.
Publikováno v:
Nanosyst. Phys. Chem. Math.
Nanosystems: Physics, Chemistry, Mathematics
Nanosystems: Physics, Chemistry, Mathematics
A series of sol-gel TiO2/CdS, TiO2 powders and coagulated CdS nanoparticles were studied by XRD, HRTEM and Raman spectroscopy to elucidate the effect of low-temperature gel aging time on visible photoluminescence (PL) emission of the TiO2/CdS composi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::0075f354530170dfa721a74d48a566c1
https://www.scopus.com/inward/record.uri?eid=2-s2.0-85101359820&doi=10.17586/2220-8054-2020-11-4-480-487&partnerID=40&md5=42496fc402c84cc31c68dea4373e07fa
https://www.scopus.com/inward/record.uri?eid=2-s2.0-85101359820&doi=10.17586/2220-8054-2020-11-4-480-487&partnerID=40&md5=42496fc402c84cc31c68dea4373e07fa
Publikováno v:
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques. 11:1039-1041
The results of transmission electron microscopy and metallographic investigation of the microstructure of FeGe2 single crystals are reported. The main defects revealed are edge dislocations, dislocation loops, and stacking faults located predominantl
Autor:
A. A. Yushkov, V. Yu Zarubin, V. Yu Kolosov, E. S. Novoselov, V. I. Pryakhina, N. V. Melnikova
Publikováno v:
PHYSICS, TECHNOLOGIES AND INNOVATION (PTI-2019): Proceedings of the VI International Young Researchers’ Conference.
Thin homogeneous amorphous films of bulk crystalline material AgSnSbS3 were obtained by thermal evaporation in vacuum. The films demonstrate stability under irradiation by focused and scanning electron beams inside transmission electron microscope at
Autor:
V. Yu Kolosov, D. K. Kuznetsov, A. A. Yushkov, S. V. Andreev, D.S. Neznakhin, N. V. Kudrevatykh
Publikováno v:
PHYSICS, TECHNOLOGIES AND INNOVATION (PTI-2019): Proceedings of the VI International Young Researchers’ Conference.
Publikováno v:
The Physics of Metals and Metallography. 116:501-508
A systematic combined study of crystal lattice distortions caused by doping and by severe plastic deformation (SPD) of Ti- and Nb-doped Ni3Al intermetallic compound has been carried out using methods of X-ray diffraction, electron microscopy, and ele