Zobrazeno 1 - 3
of 3
pro vyhledávání: '"V. V. Rezvitskii"'
Autor:
V. V. Rezvitskii, O.G. Potapova, I. I. Bondarenko, V.G. Bissergenev, E.S. Zolotova, L.A. Volkov, L. N. Mazalov, V.S. Kravchenko, B.A. Treiger
Publikováno v:
Journal of the Less Common Metals. :620-627
The technique of clusterization of electron probe microanalysis data with the help of Ward's method is described. It is shown that it can be used to evaluate the phase homogeneity of Bi-Pb-Sr-Ca-Cu-O HTSC samples. The examples of the investigation of
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::639ed14f179e8a9d8213e9e9433936a9
https://doi.org/10.1016/0022-5088(90)90268-o
https://doi.org/10.1016/0022-5088(90)90268-o
Publikováno v:
MRS Proceedings. 228
The results of the x-ray spectral investigations of CdxHg1-xTe/GaAs thin films conducted with the help of “Camebax - microbeam” electron microprobe are presented. It is shown that the sensitivity of the microprobe combined with the mathematical p
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4d1eab933978d453001a14b586cc1062
https://doi.org/10.1557/proc-228-313
https://doi.org/10.1557/proc-228-313
Autor:
V. V. Rezvitskii, V.E. Fyodorov, B.A. Treiger, N.P. Dubinin, I. I. Bondarenko, L.A. Volkov, A.G. Amelichev, L. N. Mazalov, V.F. Vratskikh
Publikováno v:
Scopus-Elsevier
The results of electron probe investigation of the samples of Y-Ba-Cu-O thin films sputtered by different methods are presented. The regularities of the thin film growth are discussed. The relative intensity of copper L alpha to K alpha lines is prop
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::0a573343319bd5fa98c631e77b4247b6
http://www.scopus.com/inward/record.url?eid=2-s2.0-44949287868&partnerID=MN8TOARS
http://www.scopus.com/inward/record.url?eid=2-s2.0-44949287868&partnerID=MN8TOARS
