Zobrazeno 1 - 10
of 116
pro vyhledávání: '"V. Stambouli"'
Publikováno v:
IEEE Journal of the Electron Devices Society, Vol 10, Pp 575-583 (2022)
In this work, we demonstrate a wafer-scale fabrication of biologically sensitive Si nanowire FET for pH sensing and electrical detection of deoxyribonucleic acid (DNA) hybridization. Based on conventional “top-down” CMOS compatible technology, ou
Externí odkaz:
https://doaj.org/article/844e17eaa3994d1686e0ba103e6aac99
Publikováno v:
ESSCIRC 2021-IEEE 47th European Solid State Circuits Conference (ESSCIRC)
ESSCIRC 2021-IEEE 47th European Solid State Circuits Conference (ESSCIRC), Sep 2021, Grenoble, France. pp.175-178, ⟨10.1109/ESSCIRC53450.2021.9567751⟩
ESSCIRC
ESSCIRC 2021-IEEE 47th European Solid State Circuits Conference (ESSCIRC), Sep 2021, Grenoble, France. pp.175-178, ⟨10.1109/ESSCIRC53450.2021.9567751⟩
ESSCIRC
In this work, a wafer-scale fabrication of biologically sensitive Si nanowire FET is demonstrated for pH sensing and electrical detection of DNA hybridization. Based on conventional “top-down” CMOS compatible technology, our bioFETs explore a wid
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::27d484172075dc43e38746d1b3160452
https://hal.archives-ouvertes.fr/hal-03429205
https://hal.archives-ouvertes.fr/hal-03429205
Akademický článek
Tento výsledek nelze pro nepřihlášené uživatele zobrazit.
K zobrazení výsledku je třeba se přihlásit.
K zobrazení výsledku je třeba se přihlásit.
Publikováno v:
Materials Science Forum. :423-426
Publikováno v:
Diamond and Related Materials. 10:2167-2173
Two methods are employed to evidenced the stress behavior in c-BN films. On the one hand, in depth stress profile of c-BN film, deposited by ion beam assisted evaporation, was performed by recording infrared spectra and substrate curvature after reac
Publikováno v:
Diamond and Related Materials. 9:1867-1875
This paper focuses on the stress dependence of infrared absorption lines of BN films synthesized by ion beam assisted deposition (IBAD) and containing various fractions of cubic phase. The compressive stress ranges from −3 to –11 GPa and is found
Publikováno v:
Applied Surface Science. 152:70-76
In situ Reflection Electron Energy Loss Spectroscopy (REELS) analyses, performed at various primary electron energies, enable us to distinguish between sp 3 and sp 2 bonding in BN films. Consequences on the c-BN growth modelling are discussed based o
Autor:
D. Bouchier, Gerard Nouet, Narcis Mestres, Vincent Mortet, M. Ben el Mekki, E. Guiot, M.A. Djouadi, V. Stambouli, J. Pascallon
Publikováno v:
Surface and Coatings Technology. :93-99
We present an optical investigation, by means of polarised infrared (IR) spectroscopy and Raman scattering, of the microstructure and crystallinity of mixed films of hexagonal and cubic boron nitride (h-BN and c-BN, respectively). The films were depo
Publikováno v:
Materials Science and Engineering: B. 59:239-243
Diamond films deposited on Si substrates by Plasma Enhanced Chemical Vapor Deposition (PECVD) were used as substrates for c-BN thin film deposition. The c-BN films were deposited at 400°C by Ion Beam Assisted Deposition (IBAD) using a mixture of nit
Publikováno v:
Diamond and Related Materials. 8:325-330
Diamond films were used as substrates for cubic boron nitride (c-BN) thin film deposition. The c-BN films were deposited by ion beam assisted deposition (IBAD) using a mixture of nitrogen and argon ions on diamond films. The diamond films exhibiting