Zobrazeno 1 - 10
of 47
pro vyhledávání: '"V. Rangelov"'
Publikováno v:
Engineering Analysis with Boundary Elements. 153:251-266
Publikováno v:
Acta Mechanica. 233:3433-3452
Publikováno v:
2019 22nd European Microelectronics and Packaging Conference & Exhibition (EMPC).
Thermo-Sonic Flip Chip Bonding (TS-FCB) is an already established technology for chip on wafer (CoW) applications in the industry. As a very fast and reliable interconnection process [1] it has been chosen for this project to temporarily tack small a
This book focuses on the mathematical potential and computational efficiency of the Boundary Element Method (BEM) for modeling seismic wave propagation in either continuous or discrete inhomogeneous elastic/viscoelastic, isotropic/anisotropic media
Publikováno v:
Trakia Journal of Sciences, Vol 20, Iss Suppl.1, Pp 86-90 (2022)
Introduction: The COVID-19 pandemic has negatively affected all aspects of public life, as well as all of the country's population. The Roma community is specific and vulnerable to communicable diseases, in particular to COVID-19. Aim: To study th
Externí odkaz:
https://doaj.org/article/f76b7ecb47d64113baaeadcaccc32680
Publikováno v:
Seismic Wave Propagation in Non-Homogeneous Elastic Media by Boundary Elements ISBN: 9783319452050
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::958796ac6388be853ff78daf22f97271
https://doi.org/10.1007/978-3-319-45206-7_1
https://doi.org/10.1007/978-3-319-45206-7_1
Akademický článek
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Autor:
V. Rangelov, S. Schüler, C. Prott, S. Irmer, Martin Strassner, J. Daleiden, Friedhard Römer, Hartmut Hillmer, A. Tarraf
Publikováno v:
Applied Physics B. 75:3-13
Tailored scaling represents a principle of success that, both in nature and in technology, allows the effectiveness of physical effects to be enhanced. Mutation and selection in nature are imitated in technology, e.g. by model calculation and design.
Publikováno v:
Microelectronic Engineering. :673-681
In this paper, we have investigated the linearity of the electrical linewidth measurement, and the relation to the linewidth values measured with a CD-SEM. The collected data has shown an almost constant bias between ELM and SEM values tested down to