Zobrazeno 1 - 10
of 32
pro vyhledávání: '"V. P. Martovitsky"'
Autor:
I. B. Krynetskii, A. S. Moskvin, V. P. Martovitsky, N. P. Shabanova, S. Yu. Gavrilkin, A. V. Varlashkin
Publikováno v:
Bulletin of the Lebedev Physics Institute. 50:48-51
Autor:
V. P. Martovitsky, Aleena Anna Thomas, Ilya Shipulin, Stefan Richter, Kornelius Nielsch, Ruben Hühne
Publikováno v:
Materials, Vol 13, Iss 3, p 630 (2020)
Materials
Volume 13
Issue 3
Materials
Volume 13
Issue 3
We performed a detailed structural, magnetotransport, and superconducting analysis of thin epitaxial Ba(Fe1&minus
xNix)2As2 films with Ni doping of x = 0.05 and 0.08, as prepared by pulsed laser deposition. X-ray diffraction studies demonstrate
xNix)2As2 films with Ni doping of x = 0.05 and 0.08, as prepared by pulsed laser deposition. X-ray diffraction studies demonstrate
Autor:
V. P. Martovitsky, A. V. Muratov, A. V. Klekovkin, A. B. Mehiya, Yu. A. Aleshchenko, V. S. Krivobok
Publikováno v:
Bulletin of the Russian Academy of Sciences: Physics. 82:418-423
Elastically strained metastable Ge1–xSn x layers with molar fractions of tin of up to 0.15 are grown on Si (001) substrates. To analyze the optical properties of the samples, photoluminescence (PL) spectra are measured at room temperature and IR tr
Autor:
E. G. Nikolaev, K. S. Pervakov, V. A. Vlasenko, V. P. Martovitsky, Yu. Eltsev, L. B. Lugansky, S.L. Bud'ko, P. C. Canfield
Publikováno v:
Journal of Superconductivity and Novel Magnetism. 31:3289-3295
We have used 75As NMR and x-ray diffraction analysis to study the structural and electronic inhomogeneities in Ba(Fe1−xNix)2As2 crystals with x near the border of the antiferromagnetic domain. Unequal nickel population of the equivalent Fe planes a
Publikováno v:
Journal of Alloys and Compounds. 880:160555
CdS/ZnSe multi quantum well (MQW) heterostructures with type II band offsets for blue-green semiconductor disk lasers were grown by metalorganic vapor-phase epitaxy (MOVPE) at T = 440 °C. The blurring of heterostructure interfaces during growth is i
Publikováno v:
Semiconductors. 50:1548-1553
A stack of five elastically strained metastable GeSn layers with a thickness of 200 nm each separated by Ge spacer layers with a thickness of 20 nm is grown on a (001) Si/Ge virtual substrate. The molar fraction of Sn in the GeSn layers is 0.005, 0.0
Autor:
V. N. Jmerik, Vladimir I. Kozlovsky, Ping Wang, Peng Jin, Weikun Ge, Tao Wang, He Chenguang, Guang Chen, V. P. Martovitsky, Xin-he Jiang, Viacheslav V. Ratnikov, Xuelin Yang, Alexey A. Toropov, Xinqiang Wang, Tobias Schulz, Xin Rong, Jun-jie Shi, Stefan Ivanov, Weiying Wang, Xu Fujun, Martin Albrecht, Zhixin Qin, Bo Shen
Publikováno v:
Advanced Materials. 28:7978-7983
Quasi-2D GaN layers inserted in an AlGaN matrix are proposed as a novel active region to develop a high-output-power UV light source. Such a structure is successfully achieved by precise control in molecular beam epitaxy and shows an amazing output p
Autor:
Stanislav A. Evlashin, Sarkis A. Dagesian, R. A. Khmelnitsky, Alexey A. Gippius, Alexandr A. Alekseev, Nikolay V. Suetin, V. P. Martovitsky, Pavel V. Pastchenko
Publikováno v:
Crystal Growth & Design. 16:1420-1427
Growth of perfect heteroepitaxial metal layers on diamond can extend applications of diamond in microelectronics and open new areas for its use in devices with unique electrical properties for operations at elevated temperatures and in harsh environm
Autor:
A. V. Varlashkin, I. B. Krynetskii, V. I. Kovalenko, S. Yu. Gavrilkin, V. P. Martovitsky, N. P. Shabanova
Publikováno v:
Bulletin of the Lebedev Physics Institute. 44:324-326
Tensometric study of n-type Bi2Se3 single crystals in dc magnetic fields to 6 T in a temperature range of 7–23 K detected a weak negative thermal expansion (NTE) in the basal plane. The NTE increases with the field strength and depends on its orien
Autor:
D. V. Averyanov, I. S. Vasil’evskii, Yu. G. Sadofyev, V. P. Martovitsky, A. V. Klekovkin, M. A. Bazalevsky
Publikováno v:
Semiconductors. 49:124-129
The growth of GeSn layers by molecular-beam epitaxy on Si (100) wafers coated with a germanium buffer layer is investigated. The properties of the fabricated structures are controlled by reflection high-energy electron diffraction, atomic-force micro