Zobrazeno 1 - 10
of 90
pro vyhledávání: '"V. P. Evtikhiev"'
Autor:
A. V. Babichev, E. S. Kolodeznyi, A.G. Gladyshev, D. V. Denisov, G. V. Voznyuk, M. I. Mitrofanov, D. A. Mikhailov, D. V. Chistyakov, D. I. Kuritsyn, V. V. Dudelev, S. O. Slipchenko, A. V. Lyutetskii, V. P. Evtikhiev, L. Ya. Karachinsky, I. I. Novikov, S. V. Morozov, G. S. Sokolovskii, N. A. Pikhtin, A. Yu. Egorov
Publikováno v:
Semiconductors. 56:1-4
Autor:
A. V. Babichev, E. S. Kolodeznyi, A. G. Gladyshev, D. V. Denisov, G. V. Voznyuk, M. I. Mitrofanov, N. Yu. Kharin, V. Yu. Panevin, S. O. Slipchenko, A. V. Lyutetskii, V. P. Evtikhiev, L. Ya. Karachinsky, I. I. Novikov, N. A. Pikhtin, A. Yu. Egorov
Publikováno v:
Semiconductors. 55:591-594
Autor:
V. P. Evtikhiev, M. I. Mitrofanov, D. I. Kuritsyn, E. S. Kolodeznyi, D. V. Denisov, G. V. Voznyuk, A. G. Gladyshev, A. V. Lyutetskii, Nikita A. Pikhtin, Anton Yu. Egorov, L. Ya. Karachinsky, A. V. Babichev, Sergey O. Slipchenko, Innokenty I. Novikov, S. V. Morozov
Publikováno v:
Semiconductors. 54:1816-1819
We have created a quantum-cascade laser with 7–8 μm wavelength and surface radiation output through a lattice formed by focused ion beam etching of the upper cladding of the waveguide. The active area of the quantum-cascade laser heterostructure w
Autor:
I. N. Grigorenko, M. N. Mizerov, G. V. Voznyuk, M. I. Mitrofanov, V. P. Evtikhiev, D. N. Nikolaev
Publikováno v:
Semiconductors. 54:1869-1872
Light-emitting devices of modern photonics are based on the semiconductor structures containing layers with various physical parameters. To preserve initial parameters during focused ion beam (FIB) lithography, it is necessary to take into account th
Autor:
L. E. Vorob’ev, D. V. Denisov, A. G. Gladyshev, M. I. Mitrofanov, Innokenty I. Novikov, D. A. Firsov, V. P. Evtikhiev, D. A. Pashnev, A. V. Babichev, G. V. Voznyuk, Nikita A. Pikhtin, A. Yu. Egorov, L. Ya. Karachinsky
Publikováno v:
Technical Physics Letters. 46:312-315
Single-mode lasing of quantum-cascade lasers with a distributed Bragg reflector formed by ion-beam etching in layers of the upper waveguide cladding is demonstrated. The active region is formed based on an In0.53Ga0.47As/Al0.48In0.52As solid-alloy he
Autor:
K. M. Morozov, I. V. Levitskii, M. A. Kaliteevski, A. V. Belonovskii, S. N. Rodin, V. P. Evtikhiev, Elizaveta I. Girshova, Konstantin A. Ivanov, Galia Pozina, M. I. Mitrofanov
Publikováno v:
Semiconductors. 54:127-130
The GaN planar hexagonal microcavities are grown by the selective vapor-phase epitaxy technique. The spectra are measured by the low-temperature cathodoluminescence method using a scanning electron microscope. The obtained spectra show a huge Rabi sp
Autor:
S. N. Rodin, A. V. Sakharov, G. V. Voznyuk, M. A. Kaliteevskii, A. F. Tsatsul’nikov, V. P. Evtikhiev, I. V. Levitskii, S. O. Usov, M. I. Mitrofanov, W. V. Lundin
Publikováno v:
Semiconductors. 53:2121-2124
The effect of annealing temperature and time on the luminescence intensity of the InGaN/GaN heterostructure subjected to ion beam etching was studied. We show that annealing at a temperature of 1100°C makes it possible to eliminate the radiation def
Autor:
Mikhail V. Maximov, A. A. Serin, G. V. Voznyuk, A. S. Payusov, M. I. Mitrofanov, M. M. Kulagina, G. O. Kornyshov, N. Yu. Gordeev, V. P. Evtikhiev
Publikováno v:
Semiconductors. 54:1811-1813
We present an approach for the treatment of coupled-ridge lasers using focused ion beam (FIB) etching. We show experimentally that the FIB etching allows post-processing lateral mode tuning without deterioration of the main laser parameters.
Autor:
V. P. Evtikhiev, M. I. Mitrofanov, A. F. Tsatsul’nikov, W. V. Lundin, G. V. Voznyuk, M. A. Kaliteevski, S. N. Rodin
Publikováno v:
Semiconductors. 54:1682-1684
A new approach for calculating the ion dose spatial distribution of the focused ion beam is proposed. The approach is based on the analysis of the secondary electron microscopy image of the area irradiated by the focused ion beam.
GaN Selective Epitaxy in Sub-Micron Windows with Different Depths Formed by Ion Beam Nanolithography
Autor:
S. O. Usov, A. F. Tsatsul’nikov, V. P. Evtikhiev, I. V. Levitskii, A. V. Sakharov, M. A. Kaliteevski, S. N. Rodin, M. I. Mitrofanov, W. V. Lundin
Publikováno v:
Physics of the Solid State. 61:2335-2337
A significant difference in the growth mechanism of spatially closed structures of gallium nitride during selective growth in submicron windows with and without penetration into the GaN sublayer was demonstrated. The mechanisms of generation and deve