Roughness of surfaces and interfaces

Autor: L. Schwalowsky, Peter Müller-Buschbaum, J.-P. Schlomka, J. Stettner, Werner Press, Metin Tolan, V. Nitz, D. Bahr, O. H. Seeck

Publikováno v: Physica B: Condensed Matter. 221:1-9

X-ray reflectivity is now a common tool for investigating density profiles of thin films and multilayers in a nondestructive manner. In contrast to the specularly reflected beam the nonspecular diffuse intensity is sensitive to the lateral structure

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::2637f6842b04b54e84e2571c8ef388f2
https://doi.org/10.1016/0921-4526(95)00897-7

X-ray diffraction from mesoscopic systems

Autor: Peter Müller-Buschbaum, Metin Tolan, D. Bahr, Martin Müller, J. Stettner, W. Press, B. Burandt, V. Nitz

Publikováno v: Physica B: Condensed Matter. 198:42-47

Two activities of our group concerning structures on mesoscopic length scales are presented: (1) CoSi 2 layers buried in Si-wafers have been studied with many scattering geometries; the emphasis is on diffuse scattering from rough interfaces and diff

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::84dcf5c128395e9927d5a060291d8f06
https://doi.org/10.1016/0921-4526(94)90123-6

Single‐cell immune profiling reveals markers of emergency myelopoiesis that distinguish severe from mild respiratory syncytial virus disease in infants.

Autor: Zivanovic, Nevena¹ (AUTHOR), Öner, Deniz¹ (AUTHOR), Abraham, Yann¹ (AUTHOR), McGinley, Joseph² (AUTHOR), Drysdale, Simon B.³ (AUTHOR), Wildenbeest, Joanne G.⁴ (AUTHOR), Crabbe, Marjolein¹ (AUTHOR), Vanhoof, Greet¹ (AUTHOR), Thys, Kim¹ (AUTHOR), Thwaites, Ryan S.⁵ (AUTHOR), Robinson, Hannah² (AUTHOR), Bont, Louis⁴ (AUTHOR), Openshaw, Peter J. M.⁵ (AUTHOR), Martinón‐Torres, Federico^6,7,8 (AUTHOR), Pollard, Andrew J.² (AUTHOR), Aerssens, Jeroen¹ (AUTHOR) jaerssens@telenet.be

Publikováno v: Clinical & Translational Medicine. Dec2023, Vol. 13 Issue 12, p1-23. 23p.

WO 3 Thin-Film Optical Gas Sensors Based on Gasochromic Effect towards Low Hydrogen Concentrations.

Autor: Mazur, Michał¹ (AUTHOR) michal.mazur@pwr.edu.pl, Kapuścik, Paulina¹ (AUTHOR) wiktoria.weichbrodt@pwr.edu.pl, Weichbrodt, Wiktoria¹ (AUTHOR) jaroslaw.domaradzki@pwr.edu.pl, Domaradzki, Jarosław¹ (AUTHOR), Mazur, Piotr² (AUTHOR) pioma@ifd.uni.wroc.pl, Kot, Małgorzata³ (AUTHOR) sowinska.gosia@gmail.com, Flege, Jan Ingo³ (AUTHOR) flege@b-tu.de

Publikováno v: Materials (1996-1944). May2023, Vol. 16 Issue 10, p3831. 17p.

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