Výsledky vyhledávání - "V. Nguyen Hoang"

Load Shedding in High-Integrated Wind Energy Power Systems Using Voltage Electrical Distance

Autor: T. G. Tran, T. A. Nguyen, M. V. Nguyen Hoang, N. A. Nguyen, T. T. Tran

Publikováno v: Engineering, Technology & Applied Science Research. 12:8402-8409

This paper presents a load shedding method for power systems with high integration of wind energy, considering their frequency response. The minimum load shedding power needed to restore system frequency to operational limits can be determined by usi

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::f2bae568e7b6438d20a5873ed5b65b42
https://doi.org/10.48084/etasr.4779

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Supervised learning vs. unsupervised learning: A comparison for optical inspection applications in quality control

Autor: D von Wrangel, J Philipps, V Nguyen Hoang, J Lehr, J Krüger

Publikováno v: IOP Conference Series: Materials Science and Engineering. 1140:012049

For the establishment of a successful quality management system in companies, the quality control of e.g. newly produced goods or the return of old and used parts is an essential component. One solution for this is the optical inspection of the surfa

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::c7e6a43346a266be98f1273a9b5c665c
https://doi.org/10.1088/1757-899x/1140/1/012049

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Investigation on Turbulence Effects on Flutter Derivatives of Suspended Truss Bridge Section

Autor: V. Nguyen-Hoang, H. Vo-Duy, L. Hoang-Trong

Publikováno v: Proceedings of the International Conference on Advances in Computational Mechanics 2017 ISBN: 9789811071485

This paper presents the flutter derivatives extracted from a stochastic state-space system identification method under difference turbulent flows. The aim of the study is to clarify the effects of oncoming turbulence on the flutter of suspended long-

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::af6ea77dfc81824f6a232336f100fda4
https://doi.org/10.1007/978-981-10-7149-2_62

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Advanced Cu interconnects using air gaps

Autor: Alexis Farcy, D. Bouchu, F. Gaillard, Romano Hoofman, L.G. Gosset, Joaquim Torres, Pascal Bancken, V. Nguyen Hoang, Greja Johanna Adriana Maria Verheijden, J. Michelon, T. Vandeweyer, Ph. Lyan, Roel Daamen, J. de Pontcharra, Vincent Arnal

Publikováno v: Microelectronic Engineering. 82:321-332

The integration of air gaps for advanced Cu interconnects is mandatory to achieve the performances required for high performance integrated circuits (ICs). The interest of their introduction as a function of the chosen architecture, i.e. hybrid (i.e.

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::8034fc4e79c100236edbe24d975b291f
https://doi.org/10.1016/j.mee.2005.07.014

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The Impact of Back-End-of-Line Process Variations on Critical Path Timing

Autor: V. Nguyen Hoang, A. Kumar, Phillip Christie

Publikováno v: 2006 International Interconnect Technology Conference.

This paper presents the method and results of a study on the impact of back-end-of-line (BEOL) process variations on the interconnect properties and therefore on the timing of critical paths of low-power circuits at the 45-nm technology node. Three c

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::9eb44580f228d61c63c638f02724b1dc
https://doi.org/10.1109/iitc.2006.1648685

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Air gap integration for the 45nm node and beyond

Autor: V. Nguyen Hoang, Greja Johanna Adriana Maria Verheijden, Pascal Bancken, Roel Daamen, T. Vandeweyer, J. Michelon, M.K. Gallagher, Romano Hoofman

Publikováno v: Proceedings of the IEEE 2005 International Interconnect Technology Conference, 2005..

First promising results including reliability and electromigration of an extendable air gap integration approach obtaining mechanically stable air cavities at the inter-metal dielectric (IMD) level are presented. Extraction of the effective dielectri

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::7d576e0fed52698aad7b7135098166d0
https://doi.org/10.1109/iitc.2005.1499997

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