Zobrazeno 1 - 5
of 5
pro vyhledávání: '"V. N. Sarykalin"'
Autor:
E. P. Novokreshchenova, A. I. Dunaev, A. I. Drozhzhin, N. K. Sedykh, A. A. Shchetinin, V. N. Sarykalin
Publikováno v:
Measurement Techniques. 21:1553-1555
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b10a330723e61377dd80914939b337d5
https://doi.org/10.1007/bf00832064
https://doi.org/10.1007/bf00832064
Publikováno v:
Measurement Techniques. 23:899-901
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8d7494fbca105ea0f6843ce951a2a598
https://doi.org/10.1007/bf00825273
https://doi.org/10.1007/bf00825273
Autor:
Ievlev, V., Kushev, S., Ovchinnikov, O.1, Sumez, M.1, Latyshev, A.1, Bezryadin, M.1, Leonova, L.1 liana.leonova@mail.ru, Kannykin, S., Vozgorkov, A.1, Smirnov, M.1
Publikováno v:
Semiconductors. Feb2014, Vol. 48 Issue 2, p251-256. 6p.
Publikováno v:
Measurement Techniques; Oct1980, Vol. 23 Issue 10, p899-901, 3p
Publikováno v:
Measurement Techniques; Nov1978, Vol. 21 Issue 11, p1553-1555, 3p