Zobrazeno 1 - 3
of 3
pro vyhledávání: '"V. M. Uzhegov"'
Publikováno v:
Безопасность информационных технологий, Vol 24, Iss 1, Pp 73-84 (2017)
The paper presents SEE rate calculation using different models. It is shown the most conservative estimate for rate prediction is thin layer model. A new approach to set IC’s SEE requirements is suggested. It is based on operational reliability fai
Externí odkaz:
https://doaj.org/article/9bfe661c008a476c882815688d5afba7
Autor:
Pavel A. Chubunov, R. G. Useinov, O. V. Meschurov, A. G. Baz, V. M. Uzhegov, Gennady I. Zebrev, P. A. Zimin, Vasily S. Anashin, Elizaveta V. Mrozovskaya
Publikováno v:
2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS).
It was shown that enhanced charge trapping takes place in thick gate dielectrics of p-MOS and MNOS dosimeters at low dose rates (ELDRS). The results are shown to be consistent with the previously proposed model.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::044927fad8f76a7450f968c55edfb5c4
https://doi.org/10.1109/radecs45761.2018.9328654
https://doi.org/10.1109/radecs45761.2018.9328654
Autor:
Rikho Nymmik, M. I. Panasyuk, M. V. Yakovlev, Nikolay Kuznetsov, V. M. Uzhegov, Natalia Nikolaeva
Publikováno v:
2015 15th European Conference on Radiation and Its Effects on Components and Systems (RADECS).
The energy spectra of the particle fluxes of radiation environment in space predicted by SPENVIS system and COSRAD software package are compared. The ERB, GCR and SEP models used in these codes are discussed.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2245dd09c957eb23c89673c7c4ae8399
https://doi.org/10.1109/radecs.2015.7365594
https://doi.org/10.1109/radecs.2015.7365594