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pro vyhledávání: '"V. M. Telegin"'
Publikováno v:
Measurement Techniques. 42:655-657
We consider the influence of tensoeffects on the TCR and relative change of resistance in resistors made of foil, thin film and thick film. This phenomenon is due to deformation of the resistive element caused by differences between the coefficients
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f4ec79bfb2634ee84a5596184d124b8f
https://doi.org/10.1007/bf02512086
https://doi.org/10.1007/bf02512086
