Zobrazeno 1 - 4
of 4
pro vyhledávání: '"V. M. Eremenko"'
Autor:
A. N. Skripchenko, O. R. Savin, V. M. Eremenko, A. I. Boriskin, V.E. Storizhko, S. N. Mordyk, S. N. Khomenko
Publikováno v:
Technical Physics. 53:927-933
The ion-optical systems of a mass spectrometer with a laser ion source and coordinate-sensitive microelectronic detector are analyzed using the matrizant method. The dispersion properties of the mass spectrometer, as well as ion beam radial and axial
Publikováno v:
Technical Physics. 49:770-774
A REMMA 102 scanning electron microscope equipped with semiconductor and wave spectrometers is applied to measure the copper and zinc concentrations in the surface layers of an M161 brass sample and the same sample subjected to a focused laser radiat
Publikováno v:
Soviet Journal of Quantum Electronics. 13:875-877
It is shown that materials with different physical properties are characterized by different widths of the linear part of the dependence of the charge reaching the slit of a mass-spectrograph monitor on the number of laser pulses. This difference and
Autor:
I. M. Bronevskaya, M. I. Treiger, A. A. Tsyganok, A. G. Tolmacheva, V. M. Eremenko, S. V. Venel
Publikováno v:
Chemistry and Technology of Fuels and Oils. 12:468-470
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