Zobrazeno 1 - 10
of 36
pro vyhledávání: '"V. M. Bermudez"'
Autor:
V. M. Bermudez
Publikováno v:
The Journal of Physical Chemistry B. 109:9970-9979
Single-wall carbon nanotubes (SWNTs), deposited onto an Al substrate from a liquid suspension, have been cleaned by annealing in ultrahigh vacuum. The effects of exposing the sample in situ to atomic H (or D) and/or to dimethyl methylphosphonate [DMM
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::e4a9222e88cb716cd4ad958ccdf57a47
https://doi.org/10.1021/jp0508150
https://doi.org/10.1021/jp0508150
Autor:
V. M. Bermudez, W. J. DeSisto
Publikováno v:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 19:576-583
Polarization-modulated infrared reflection absorption spectroscopy (aided by numerical modeling) is demonstrated as a potentially useful tool for the study of the chemistry of materials growth and processing under steady-state conditions. This approa
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3b75818b7129609124d979735413b9a0
https://doi.org/10.1116/1.1339008
https://doi.org/10.1116/1.1339008
Autor:
V. M. Bermudez
Publikováno v:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 16:2572-2580
Thin crystalline films of Al2O3 have been grown by reaction of a NiAl(111) surface with chemisorbed O at elevated temperature. The resulting Al2O3/NiAl buried metal layer structure has then been used as a substrate for studies of NH3 adsorption under
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::48ec571d7614c5d9d60bbc49f302eac4
https://doi.org/10.1116/1.581384
https://doi.org/10.1116/1.581384
Publikováno v:
Physical Review Letters. 76:991-994
The marked polarization dependences of two C-1s surface-core-exciton transitions---as revealed by near-edge x-ray absorption fine structure on single-domain $\ensuremath{\beta}\ensuremath{-}\mathrm{SiC}(100)\ensuremath{-}c(2\ifmmode\times\else\textti
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::255ef6e12ebf9a799748ce4d0a13282d
https://doi.org/10.1103/physrevlett.76.991
https://doi.org/10.1103/physrevlett.76.991
Autor:
V. M. Bermudez
Publikováno v:
The Journal of Physical Chemistry. 98:2469-2477
Infrared reflection absorption spectroscopy has been used to study the adsorption and coadsorption of Ga-(C 2 H 5 ) 3 (TEG), NH 3 , and N 2 H 4 at 120-160 K on MgO films grown epitaxially on Mo(100). All three species adsorb molecularly and, upon war
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::82d9261b468209441fc12dd00231b5bf
https://doi.org/10.1021/j100060a040
https://doi.org/10.1021/j100060a040
Autor:
V. M. Bermudez
Publikováno v:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 10:3478-3485
Infrared reflection absorption spectroscopy has been used to study the chemisorption of fluorine (by exposure to XeF2) on polycrystalline Si surfaces in ultrahigh vacuum and under low‐pressure steady‐state conditions. Adsorption at 300 K leads to
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::eae779627b244f66c154a4a204745885
https://doi.org/10.1116/1.577806
https://doi.org/10.1116/1.577806
Autor:
V. M. Bermudez
Publikováno v:
Journal of Applied Physics. 71:5450-5459
The growth of SiC films on Si by reaction with tetraethyl silane (SiEt4) has been studied using Auger and electron energy‐loss spectroscopies, low‐energy electron diffraction, and external‐reflection infrared reflection absorption spectroscopy
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b4e3ed8785db75de1aa1cb8f8ccab8c1
https://doi.org/10.1063/1.350516
https://doi.org/10.1063/1.350516
Autor:
V. M. Bermudez
Publikováno v:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 10:152-157
The reflection of mid‐infrared (IR) radiation from a non‐absorbing (dielectric) layer of varying thickness on a semiinfinite metallic substrate is modeled using the classical Fresnel relations. Reflectance, phase shift, and field intensity are ca
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d123a564d49fb2f23ce961f1b91d4d3b
https://doi.org/10.1116/1.578128
https://doi.org/10.1116/1.578128
Autor:
A. S. Glass, V. M. Bermudez
Publikováno v:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 8:2622-2626
Fourier transform infrared reflection‐absorption spectroscopy has been used to study CO adsorbed on clean Ni(100) and on surfaces with coadsorbed H and/or carbidic C. Data showing high adsorbate coverages at high CO and/or H2 pressures (up to 1.0 T
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ff4687c35dd34fe8079923a59c86354e
https://doi.org/10.1116/1.576682
https://doi.org/10.1116/1.576682