Applying Genetic Algorithm for test pattern generation process optimization

Autor: V. I. Kuraedov

Publikováno v: Вестник Дагестанского государственного технического университета: Технические науки, Vol 51, Iss 1, Pp 113-122 (2024)

Objective. Comprehensive integrated circuit (IC) verification plays a crucial role in preventing costly errors and delays in product development cycle. It includes testing interaction and compatibility of different system elements, such as central pr

Externí odkaz: https://doaj.org/article/5561de7af3df4b2d8bdc7426755d9638