Zobrazeno 1 - 10 of 163 pro vyhledávání: '"V. G. Kohn"'
1
Akademický článek
On the theory of synchrotron radiation nanofocusing with planar compound refractive lenses
Autor: V. G. Kohn
Publikováno v: Journal of Synchrotron Radiation, Vol 29, Iss 3, Pp 615-621 (2022)
Two new methods of computer simulation of synchrotron radiation nanofocusing with planar compound refractive lenses (PCRLs) are presented. The methods are based on the results of analytical theory. In contrast to previous works, the new methods take
Externí odkaz: https://doaj.org/article/b263116a60a44a0a887d7031fdc3e70a
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2
Akademický článek
Capsule-like voids in SiC single crystal: Phase contrast imaging and computer simulations
Autor: V. G. Kohn, T. S. Argunova, J. H. Je
Publikováno v: AIP Advances, Vol 4, Iss 9, Pp 097134-097134-7 (2014)
The results of observation of capsule-like voids in silicon carbide (6H-SiC) single crystal by means of a phase contrast imaging technique with synchrotron radiation at the Pohang Light Source as well as computer simulations of such images are presen
Externí odkaz: https://doaj.org/article/eba384cee7c04130a4ea32f9f43a0c50
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3
Akademický článek
Quantitative hard x-ray phase contrast imaging of micropipes in SiC
Autor: V. G. Kohn, T. S. Argunova, J. H. Je
Publikováno v: AIP Advances, Vol 3, Iss 12, Pp 122109-122109-11 (2013)
Peculiarities of quantitative hard x-ray phase contrast imaging of micropipes in SiC are discussed. The micropipe is assumed as a hollow cylinder with an elliptical cross section. The major and minor diameters can be restored using the least square f
Externí odkaz: https://doaj.org/article/a4dee91b168a492eb2679e24fb3385ca
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8
New kind of interference in the case of X-ray Laue diffraction in a single crystal with uneven exit surface under the conditions of the Borrmann effect. Analytical solution
Autor: I. A. Smirnova, V. G. Kohn
Publikováno v: Acta Crystallogr A Found Adv
The analytical solution of the problem of X-ray spherical-wave Laue diffraction in a single crystal with a linear change of thickness on the exit surface is derived. General equations are applied to a specific case of plane-wave Laue diffraction in a
Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::5c8948f56861fca0b441021b8e25ffaa
https://doi.org/10.1107/s2053273320003794
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9
Theory of Two-Beam X-Ray Diffractometry Method Using Synchrotron Radiation
Autor: V. G. Kohn
Publikováno v: Crystallography Reports. 64:16-23
An accurate theory of the new method of two-beam X-ray diffractometry using synchrotron radiation has been developed. In this method, a beam from the source is reflected from two monochromator crystals without changing direction and then is collimate
Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::556b3402d9c5a79180ee9a73f2d79ff7
https://doi.org/10.1134/s1063774519010127
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10
Experimental Study of Two-Beam X-Ray Diffractometry Using Synchrotron Radiation
Autor: A. E. Blagov, A. Yu. Seregin, P. A. Prosekov, Mikhail V. Kovalchuk, V. G. Kohn, Yu. V. Pisarevsky, A. G. Kulikov
Publikováno v: Crystallography Reports. 64:24-29
A new scheme of two-beam X-ray diffractometry on the “X-Ray Crystallography and Physical Materials Science” (XCPM) beamline at the Kurchatov Synchrotron Radiation Source (KSRS) has been experimentally investigated. The scheme includes a standard
Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::f60bdd6942d4aef2cc45813cf77c2a76
https://doi.org/10.1134/s1063774519010139
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