Zobrazeno 1 - 10
of 19
pro vyhledávání: '"V. G. Beshenkov"'
Publikováno v:
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques. 13:941-945
The problem of diagnosing the elemental composition of PZT (lead zirconate titanate) films on platinum is solved by X-ray microprobe analysis. The resulting compositions differ markedly for thin (thickness of 300 nm, conventional for microelectronic
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::61f502767fe90671f428894799844316
https://doi.org/10.1134/s1027451019050227
https://doi.org/10.1134/s1027451019050227
Publikováno v:
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques. 12:861-865
The problem concerning the diagnostics of the phase composition of lead-zirconate-titanate (PZT) films under conditions of overlapping Raman spectra is solved via applied mathematical statistics. The proposed phase-identification method based on refe
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b83cdc6cefde029f71777900d83cffa4
https://doi.org/10.1134/s102745101805004x
https://doi.org/10.1134/s102745101805004x
Publikováno v:
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques. 12:159-162
The problem of diagnostics of the phase composition of lead-zirconate-titanate (PZT) layers under conditions of overlapped Raman spectra is solved by means of applied mathematical statistics. The spectra measured on the surface of the multiphase mate
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c8fe4e547a158fba2b853a211fe6b8b9
https://doi.org/10.1134/s1027451018010238
https://doi.org/10.1134/s1027451018010238
Publikováno v:
Technical Physics Letters. 40:644-647
The peculiarities of the growth of PZT films on heteroepitaxial Ir/YSZ/Si structures under conditions of cathode radio-frequency sputtering of a ceramic target in argon-oxygen mixtures have been studied. It is shown that sputtering in a gas mixture w
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ad4c8e6a0c8e8d5ba801f88287dfb165
https://doi.org/10.1134/s1063785014080045
https://doi.org/10.1134/s1063785014080045
Publikováno v:
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques. 6:873-876
It is shown that film exfoliation in a PZT(400 nm)/Ir(50 nm)/TiO2(10 nm)/Ti(10 nm)/SiO2/Si system upon annealing in air at 650°C for 20 min occurs at the PZT/Ir interface along a thin intermediate oxide layer (Pb, Ir)O x containing a significant amo
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::289e8172137ba310163dedc6ae257d84
https://doi.org/10.1134/s1027451012110031
https://doi.org/10.1134/s1027451012110031
Autor:
V. A. Marchenko, V. G. Beshenkov, L. A. Fomin, D.V. Irzhak, A. G. Znamenskii, V.I. Nikolaichik
Publikováno v:
Thin Solid Films. 520:6888-6892
Heteroepitaxial Ir films on Si(001) with a double ceria/yttria stabilized zirconia heteroepitaxial buffer layer were grown by magnetron sputtering. As-deposited CeO 2 films covered with {111} faceted pyramids resulted in iridium films with the [001]
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3e5662b6cf9ea23e6074e91ae801f69b
https://doi.org/10.1016/j.tsf.2012.07.033
https://doi.org/10.1016/j.tsf.2012.07.033
Publikováno v:
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques. 5:930-933
In this study it has been found that a TiO2/Ti double adhesion layer is used for SiO2/Si substrate and a YSZ layer is used for SiO2/Si and Si substrates to achieve high residual polarization of PZT layers on platinum. Epitaxial deposition of YSZ on S
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::65fc0751fbd12539991582758ab30364
https://doi.org/10.1134/s1027451011100041
https://doi.org/10.1134/s1027451011100041
Publikováno v:
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques. 4:761-765
The composition of PZT thin films deposited by diode HF sputtering of a ceramic target on Pt/Ti/SiO2/Si substrates was studied. The remanent polarization of grown films was to 22 μC/cm2. A technique for verifying the adequacy of elemental and phase
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::858137fa0f2156e3895581f215eb8720
https://doi.org/10.1134/s1027451010050113
https://doi.org/10.1134/s1027451010050113
Autor:
E. S. Demidov, S. N. Gusev, V. G. Beshenkov, M. V. Sapozhnikov, S. Yu. Zubkov, D. E. Nikolitchev, V. P. Lesnikov, S. A. Levchuk, V. V. Podol’ski
Publikováno v:
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques. 4:366-373
The results of studying random silicon-manganese alloys with Mn concentration increased up to 50 at % and discrete alloys (multilayer structures with silicon and manganese layers 5–20 and 1–5 nm thick, respectively) deposited from laser plasma ar
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4959c7ee7f37cd6bf48a92eaff66f113
https://doi.org/10.1134/s102745101003002x
https://doi.org/10.1134/s102745101003002x
Publikováno v:
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques. 2:705-708
To investigate the composition of interfaces of thin CeO2 films on silicon, two diagnostic approaches, the elemental and phase composition analyses by Auger spectra under ion profiling, are used. The interrelation between the conditions of epitaxial
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1932d49f8aee804fb8eeedfde7d54039
https://doi.org/10.1134/s1027451008050078
https://doi.org/10.1134/s1027451008050078