Zobrazeno 1 - 4
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pro vyhledávání: '"V. A. Tovma"'
Autor:
V. R. Tovma
Publikováno v:
МІЖКУЛЬТУРНА КОМУНІКАЦІЯ В КОНТЕКСТІ ГЛОБАЛІЗАЦІЙНОГО ДІАЛОГУ: СТРАТЕГІЇ РОЗВИТКУ. Ч 2.
Autor:
O. Yu. Andriyanova, O. A. Kulay, V. V. Tovma, S. M. Babanina, E. V. Khmil, V. V. Danilenko, L. F. Kaskova
Publikováno v:
Bulletin of Problems Biology and Medicine. 2:334
Publikováno v:
Measurement Techniques. 30:1070-1072
Publikováno v:
Cryogenics. 8:390-392
(106 x room temperature) at low temperature, the quantity that determines the electron mean free path as the film thickness. However, the electron mean free paths of our films are not as long as those of andlum and tm films, and the situation is diff