Zobrazeno 1 - 10
of 12
pro vyhledávání: '"V. A. Tovma"'
Autor:
V. R. Tovma
Publikováno v:
МІЖКУЛЬТУРНА КОМУНІКАЦІЯ В КОНТЕКСТІ ГЛОБАЛІЗАЦІЙНОГО ДІАЛОГУ: СТРАТЕГІЇ РОЗВИТКУ. Ч 2.
Autor:
O. Yu. Andriyanova, O. A. Kulay, V. V. Tovma, S. M. Babanina, E. V. Khmil, V. V. Danilenko, L. F. Kaskova
Publikováno v:
Bulletin of Problems Biology and Medicine. 2:334
Publikováno v:
Measurement Techniques. 30:1070-1072
Publikováno v:
Cryogenics. 8:390-392
(106 x room temperature) at low temperature, the quantity that determines the electron mean free path as the film thickness. However, the electron mean free paths of our films are not as long as those of andlum and tm films, and the situation is diff
Publikováno v:
IEEE Transactions on Magnetics; 1983, Vol. 19 Issue 3, p1105-1108, 4p
Autor:
Novosel'tsev, A. P.
Publikováno v:
Russian Studies in History; Jan1974, Vol. 12 Issue 3, p37-70, 34p
Autor:
Roberts, B. W.
Publikováno v:
Journal of Physical & Chemical Reference Data; 1976, Vol. 5 Issue 3, p581-822, 242p
Publikováno v:
Measurement Techniques; Nov1987, Vol. 30 Issue 11, p1070-1072, 3p
Publikováno v:
Measurement Techniques; Nov1987, Vol. 30 Issue 11, p1068-1070, 3p
Autor:
Vul, B. M., Karasik, V. R., Kopylovskii, B. D., Kurganov, G. B., Vysotskii, V. S., Pronkin, D. V., Efimov, Yu A., Agapov, G. I.
Publikováno v:
Soviet Journal of Quantum Electronics; 1975, Vol. 4 Issue 9, p1-1, 1p