Zobrazeno 1 - 10
of 13
pro vyhledávání: '"V. A. Tkal"'
Publikováno v:
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques. 10:231-240
The absolute value and argument of discrete Fourier transform (DFT) coefficients are investigated by analyzing images of test objects and structural defects in single crystals, which are theoretically calculated from modified Indenbom–Chamrov equat
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::eb0ec5afc983dd224d1c4dfda48f8ec9
https://doi.org/10.1134/s1027451015060403
https://doi.org/10.1134/s1027451015060403
Autor:
V. A. Tkal, I. A. Zhukovskaya
Publikováno v:
Inorganic Materials. 50:1444-1454
The most effective methods of digital processing based on the analysis of the brightness and frequency characteristics of the topographic and polarization-optical contrasts of structural defects are considered by example of single crystals of Si and
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::85609d8464f18325f418548cc05a1dc0
https://doi.org/10.1134/s0020168514150175
https://doi.org/10.1134/s0020168514150175
Autor:
M. N. Petrov, V. A. Tkal
Publikováno v:
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques. 5:419-425
A simple procedure for quantitative estimation of the quality and efficiency of digital processing based on discrete wavelet transform (DWT) of X-ray topographic and polarization-optical images for single crystal structure defects is proposed. Digita
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::03ddb55c1dd1e9c51f69cb8d4b2b48a8
https://doi.org/10.1134/s102745101105017x
https://doi.org/10.1134/s102745101105017x
Publikováno v:
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques. 4:25-31
The procedure for eliminating the background nonuniformity of the polarization-optical contrast of a 6H-SiC single crystal by digital processing based on the frequency analysis of images is considered in this paper. This procedure involves separating
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a7082ff9c42fe1ee7d3f24ce3206ab26
https://doi.org/10.1134/s1027451010010052
https://doi.org/10.1134/s1027451010010052
Publikováno v:
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques. 3:797-803
We present computer simulation results for the images of various types of structural defects in 6H-SiC and Si single crystals with taking into account noise factors (background heterogeneity and contrast graininess). If we know the parameters used to
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a922c13221f25b525fae8b7e9e3534d4
https://doi.org/10.1134/s1027451009050231
https://doi.org/10.1134/s1027451009050231
Publikováno v:
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques. 1:277-285
For a 6H-SiC single crystal, experimental results of the digital processing of topographic images with various dynamic ranges are given. In this case, wavelet analysis was used. The images were obtained by x-ray topography based on the Borrmann effec
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e6d6a4fda49160daea4bd495ffad4e18
https://doi.org/10.1134/s1027451007030093
https://doi.org/10.1134/s1027451007030093
Publikováno v:
Physics of the Solid State. 48:2084-2090
Section topographs of edge and screw dislocations with an axis along [0001] in 6H-SiC are taken and interpreted, and the image formation is explained for this case. The contrast induced by various arrangements of dislocations within the Borrmann tria
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e24264ac7098cdc0bd05182c622c7246
https://doi.org/10.1134/s1063783406110072
https://doi.org/10.1134/s1063783406110072
Publikováno v:
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques. 2:931-933
The possibility of detecting growth striations by digital processing based on analysis of the brightness and frequency characteristics of images has been demonstrated by the example of x-ray topographic contrast of a GaSb(Si) single crystal. It has b
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c3bf473622534eafaedd198a614cef0c
https://doi.org/10.1134/s1027451008060190
https://doi.org/10.1134/s1027451008060190
Publikováno v:
Refractories. 33:186-187
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0839a5999a907bb6290d6918327b3a5e
https://doi.org/10.1007/bf01283562
https://doi.org/10.1007/bf01283562
Publikováno v:
Journal of Applied Spectroscopy. 34:237-241
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4f8ab4420c37bc8e338226f3becd6599
https://doi.org/10.1007/bf00635215
https://doi.org/10.1007/bf00635215