Zobrazeno 1 - 9
of 9
pro vyhledávání: '"V. A. Marfin"'
Autor:
A. O. Teplyakova, A. Yu. Egorov, V. D. Kalashnikov, A. V. Ulanova, V. A. Marfin, M. A. Rogovaia
Publikováno v:
2022 Moscow Workshop on Electronic and Networking Technologies (MWENT).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7b6725317f8cb775cea0b8655b1f9f26
https://doi.org/10.1109/mwent55238.2022.9802295
https://doi.org/10.1109/mwent55238.2022.9802295
Autor:
D. V. Bobrovsky, V. A. Marfin, P. V. Nekrasov, I.O. Loskutov, N. D. Kravchenko, Anatoly A. Smolin, Andrey V. Yanenko
Publikováno v:
2021 International Siberian Conference on Control and Communications (SIBCON).
the paper presents a broad investigation of single event effects in ARM microcontroller (MCU) under heavy ion irradiation. Experimental details are presented: device under the test and test setup. The stages of experiments are described: radiation te
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::230e625613bf22df056a77d5999fc52a
https://doi.org/10.1109/sibcon50419.2021.9438916
https://doi.org/10.1109/sibcon50419.2021.9438916
Publikováno v:
Russian Microelectronics. 46:171-179
This paper analyzes the specifics of digital signal processors’ (DSPs) radiation-induced failures. The general methodology, as well as the hardware and software, for the functional testing (FT) of DSPs in radiation experiments is developed and impl
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::156b0044617a9a6c9611575d300caaa0
https://doi.org/10.1134/s1063739717030052
https://doi.org/10.1134/s1063739717030052
Publikováno v:
2017 IEEE 30th International Conference on Microelectronics (MIEL).
The paper describes the dependence of the SEU cross-section on the clock frequency for a CMOS 0.18um microprocessor's test chip. An attempt has been made to find the relationship between the parameter of the minimum supply voltage and the frequency d
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4c843b615671ed977249178cec162d8b
https://doi.org/10.1109/miel.2017.8190129
https://doi.org/10.1109/miel.2017.8190129
Publikováno v:
MATEC Web of Conferences, Vol 79, p 01037 (2016)
The article considers the implementation of the external memory interface based on National Instruments modular PXI equipment for environmental testing of digital signal processing (DSP) microprocessors. The block diagram of the developed device poin
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::62e4e05cad37fe1025a88658afcf1415
https://doaj.org/article/e5f0c919f40844d2b2f3e29964c2e2d7
https://doaj.org/article/e5f0c919f40844d2b2f3e29964c2e2d7
Publikováno v:
2015 15th European Conference on Radiation and Its Effects on Components and Systems (RADECS).
the article is devoted to the study of single event functional interrupts in microprocessors and microcontrollers. SEFI detection method is discussed. The influence of supply voltage, operating frequency and program code on SEFI cross section is exam
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1a3d0bedeecd800da4d97c1783344d62
https://doi.org/10.1109/radecs.2015.7365625
https://doi.org/10.1109/radecs.2015.7365625
Publikováno v:
2015 15th European Conference on Radiation and Its Effects on Components and Systems (RADECS).
The article describes an original technique for TID testing of complex VLSI circuits (microprocessors) based on combined use of parametric and functional control. The resulting dependences obtained in radiation experiment are qualitatively confirmed
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2fd5742dcdff6862c67a91947718d1f0
https://doi.org/10.1109/radecs.2015.7365595
https://doi.org/10.1109/radecs.2015.7365595
Autor:
V. P. Meshcheryakov, V. M. Izrail'son, B. A. Atayants, V. P. Marfin, B. V. Kagalenko, A. I. Kiyashev, F. Z. Rozenfel'd
Publikováno v:
Measurement Techniques. 29:552-556
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3e14c883495056efe78758d185d34268
https://doi.org/10.1007/bf00865819
https://doi.org/10.1007/bf00865819
Publikováno v:
Measurement Techniques. 24:1013-1015
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::51e962d4e62f434166c573141416d0ab
https://doi.org/10.1007/bf00825772
https://doi.org/10.1007/bf00825772