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Autor:
V. S. Prosolovich, V. B. Odzhayev, A. K. Panfilenko, Yu. N. Yankovsky, V. V. Buslyuk, V. A. Filipyenya, A. N. Petlitsky
Publikováno v:
Russian Microelectronics. 49:295-301
The physical parameters of the silicon noise-generator diodes manufactured on single-crystalline silicon substrates by planar technology are studied by the method of the measurement of the current–voltage characteristics (I–V curves) and capacity