Zobrazeno 1 - 5
of 5
pro vyhledávání: '"V. A. Chubarenko"'
Publikováno v:
Semiconductors. 37:636-640
Experimental data on the distribution and atomic fractions of elements in Bi2Te2.94Se0.06, Bi2Te2.88Se0.12, Bi1.99Sn0.01Te2.94Se0.06, and Bi1.99Sn0.01Te2.88Se0.12 are discussed; these data were obtained using X-ray electron-microprobe analysis and X-
Autor:
R. M. Zakalyukin, V. S. Boyarkov, Pavel P. Fedorov, V. A. Chubarenko, A. E. Kokh, N. G. Kononova
Publikováno v:
Crystallography Reports. 47:559-565
The impurities in single crystals of the low-temperature β modification of BaB2O4 grown from flux in the BaB2O4-Na2O system have been studied. The β-BaB2O4 compound was examined by X-ray powder diffraction analysis. The appearance of scattering cen
Publikováno v:
Russian Microelectronics. 30:187-190
Anodic alumina containing nickel deposited into its nanopores was investigated using a scanning electron probe microanalyzer and an X-ray microdiffractometer. It was demonstrated that electrochemically deposited nickel contains no foreign impurities,
Publikováno v:
Journal of Experimental and Theoretical Physics. 86:1228-1233
Magnetic resonance of the low-frequency spin-wave branch in the Bi2CuO4 antiferromagnet with an easy-plane anisotropy has been studied. Angular, frequency, and temperature dependences of the position and width of the antiferromagnetic resonance (AFMR
Publikováno v:
Journal of Experimental and Theoretical Physics Letters. 64:274-278
Abrupt jumps are observed on the temperature dependences of the electrical conductivity of La1− xBixMnO3+δ (0.1