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Autor:
V. A. Trepakov, V. Studni ccaron, Miroslav Jelinek, M. Čer ňansk, I. Fedorov, V. Trtík, V. Železn, Jan Petzelt
Publikováno v:
Ferroelectrics. :413-427
Far-infrared transmittance of a SrTiO3 thin film deposited on a sapphire substrate by laser ablation was measured in the frequency range 25–200 cm–1 at temperatures from 5K up to 300 K. An interesting difference between the temperature behaviour