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Autor:
V.V. Strelchuk, А.І. Ievtushenko, А.М. Kаsumov, V.М. Kаravaieva, М.М. Zahornyi, S.F. Kоrychev, О.І. Bykov, О.F. Kolomys, K.А. Kоrotkov, V.О. Yukhymchuk
Publikováno v:
Semiconductor Physics, Quantum Electronics and Optoelectronics. 24:139-147
The properties of nanosized ZnO:Ho thin films deposited by explosive evaporation method have been studied. This work is aimed at studying the effect of high deposition rate on the oxide characteristics interesting from the viewpoint of photocatalysis