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Autor:
A., Pikuz T., Ya., Faenov A., Matsuoka, T., Albertazzi, B., Ozaki, N., Hartely, N., Muray, Ricardo Arturo O., Yabuuchi, T., Habara, H., Matsuyama, S., Yamauchi, K., Inubushi, Y., Togashi, T., yumoto, H., Tange, Y., Tono, K., Sato, Y., Yabashi, M., Mitrofanov, A., A., Pikuz S., Bleiner, D., Grum-Grzhimailo, A., N., Rosanov N., V., Vysotina N., Harmand, M., Koenig, M., A., Tanaka K., Ishikawa, T.
Publikováno v:
Proceedings of the 15th International Conference on X-Ray Lasers. 202:109-116
We present here a new diagnostics based on using LiF crystal detectors that are able to perform measurements an intensity distribution of X-rays beams with diameters ranging from some microns up to some centimeters with high spatial resolution (~1 mi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=jairo_______::dbbaf75bec648f1ccdf026790e6baee0
https://repo.qst.go.jp/records/48934
https://repo.qst.go.jp/records/48934
