Zobrazeno 1 - 10
of 11
pro vyhledávání: '"V N Shukla"'
Publikováno v:
2023 International Conference on Artificial Intelligence and Smart Communication (AISC).
Autor:
V. N. Shukla, Tijender
Publikováno v:
International Journal of Engineering Research and.
Publikováno v:
International Journal of Computer Applications. 56:12-17
While a country is surging ahead from a developing country to the status of a developed nation, the term "Development" has a connotation, both in terms of macro-level or micro-level development. When referred at the country level it becomes macro-lev
Autor:
Khanuja S.P.S., V N Shukla
Publikováno v:
ChemInform. 36
Autor:
Chitra Dorai, V N Shukla
Publikováno v:
IETE Technical Review. 5:455-458
Display memory in a graphic system is a shared resource, which must be accessible to both the CRT controller as well as the CPU. Since the CRT controller's access has to go on uninterrupted, for screen refresh, the CPU must be made to wait, to avoid
Autor:
V N Shukla
Publikováno v:
IETE Technical Review. 5:481-485
Publikováno v:
Ferroelectrics. 28:383-386
Bi2WO6 is a polar materials in the bismuth titanate family, Bi2Mn-1RnO3n+3. Additions of NaF to a Na2WO4 - WO3 flux yielded large single crystals up to 0.8 mm thick, which were free of inclusions. Total impurities were less than 500 ppm, and the crys
Autor:
Jagdish Narayan, V. N. Shukla
Publikováno v:
Journal of Applied Physics. 51:3444-3446
A new technique based on deposition of metallic film at room temperature followed by laser irradiation, for the formation of Ohmic Contacts on semiconducting oxides, has been developed. Aluminum or nickel film about 1 μm thick was deposited on n‐t
Autor:
V. N. Shukla, S. J. Lukasiewicz, A. F. Schreiner, N. Biunno, S. J. Pennycook, Rajiv K. Singh, J. Narayan
Publikováno v:
Applied Physics Letters. 51:940-942
We have investigated the microstructure and properties of YBa2Cu3O9−δ that contain resistive transitions at 90 and near 290 K using high‐resolution and analytical transmission electron microscopy and Raman scattering techniques. The specimens co
Publikováno v:
Materials Research Express; Oct2019, Vol. 6 Issue 10, p1-1, 1p