Zobrazeno 1 - 5
of 5
pro vyhledávání: '"Víctor Hugo Flores-Ochoa"'
Autor:
Luis Alberto Rodríguez-Picón, Luis Carlos Méndez-González, Víctor Hugo Flores-Ochoa, Iván JC Pérez Olguín, Vicente García
Publikováno v:
Quality Technology & Quantitative Management. :1-21
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7818056aa91fc47ae5433949d1ca4dad
https://doi.org/10.1080/16843703.2022.2146904
https://doi.org/10.1080/16843703.2022.2146904
Autor:
Luis Alberto Rodríguez-Picón, Víctor Hugo Flores-Ochoa, Manuel Arnoldo Rodríguez-Medina, Luis Carlos Méndez-González
Publikováno v:
The International Journal of Advanced Manufacturing Technology. 104:4143-4153
Positional characteristics can be found in many manufactured products. This type of quality characteristics requires the use of capability indices to measure their performance regarding a circular tolerance region and the center of this region. Diffe
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9a7c2f807df81a78f2cdca67e8cb56e7
https://doi.org/10.1007/s00170-019-04197-w
https://doi.org/10.1007/s00170-019-04197-w
Autor:
Luis Carlos Méndez-González, Manuel Arnoldo Rodríguez-Medina, Luis Alberto Rodríguez-Picón, Víctor Hugo Flores-Ochoa
Publikováno v:
Journal of Statistical Computation and Simulation. 87:2207-2226
In this paper, we consider that the degradation of two performance characteristics of a product can be modelled by stochastic processes and jointly by copula functions, but different stochastic processes govern the behaviour of each performance chara
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::182a6c81179487e8d5753d5b9566e35b
https://doi.org/10.1080/00949655.2017.1324858
https://doi.org/10.1080/00949655.2017.1324858
Publikováno v:
International Journal of System Assurance Engineering and Management. 8:1026-1040
In this article, different models for reliability inference of devices affected by more than one accelerating variable in accelerated life tests are presented. General log-linear relationship is modeled with the lognormal and Weibull distributions co
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::403869f8d896fe01ff070a3b708b26f2
https://doi.org/10.1007/s13198-016-0564-6
https://doi.org/10.1007/s13198-016-0564-6
Autor:
Rodríguez-Picón, Luis Alberto1 (AUTHOR) luis.picon@uacj.mx, Méndez-González, Luis Carlos1 (AUTHOR), Flores-Ochoa, Víctor Hugo2 (AUTHOR), Pérez Olguín, Iván JC1 (AUTHOR), García, Vicente3 (AUTHOR)
Publikováno v:
Quality Technology & Quantitative Management. Nov2023, Vol. 20 Issue 6, p730-750. 21p.