Zobrazeno 1 - 10
of 68
pro vyhledávání: '"Václav Valvoda"'
Autor:
V. Železný, Dagmar Chvostova, L. Pajasová, Tomáš Kocourek, Miroslav Jelinek, Stanislav Daniš, Václav Valvoda
Publikováno v:
Thin Solid Films. 571:416-419
Optical properties of Ba 0.75 Sr 0.25 TiO 3 (BST(75/25)) ferroelectric thin film have been investigated by spectroscopic ellipsometry in a broad temperature interval from 10 to 300 K. The polycrystalline perovskite-phase BST films were prepared by pu
Autor:
Václav Valvoda, M. Brunclíková, J. Olejníček, M. Kohout, O. Churpita, Dagmar Chvostova, Martin Cada, Jiří Šmíd, Stepan Kment, Martin Zlámal, Zdeněk Hubička, P. Adámek, Petra Kšírová
Publikováno v:
Catalysis Today. 230:119-124
Multi plasma jet system with 4 independent nozzles working on the principle of surface-wave discharge (SWD) has been developed. The system was optimized and used for plasma-enhanced chemical vapor deposition (PECVD) of nominally pure and Al and Mn do
Autor:
Lubomir Jastrabik, P. Virostko, Milan Tichý, O. Churpita, Martin Cada, P. Adámek, A. Deyneka, Václav Valvoda, Zdeněk Hubička, J. Olejníček
Publikováno v:
Contributions to Plasma Physics. 48:515-520
Low-pressure plasma jet system with two hollow cathodes was used for deposition of BaxSr1–xTiO3 (BSTO) ferroelectric thin films. Two RF hollow cathode plasma jet guns were pointed to the substrate where BSTO thin films were deposited. High density
Publikováno v:
Materials Science Forum. :115-118
The thickness measurement based on absorption of X-rays in thin films has been tested on a polycrystalline titanium nitride films deposited on a tungsten carbide substrate. Intensities of three reflections from each material were measured for inciden
Publikováno v:
Journal of Physics: Condensed Matter. 14:10021-10032
The capabilities of small-angle x-ray scattering (SAXS) and wide-angle x-ray diffraction (XRD) to recognize structural changes in periodic multilayers were compared on Fe/Au multilayers with different degrees of structural degradation. Experimental r
Autor:
Josef Zweck, David Rafaja, Václav Valvoda, Daniel Šimek, Jirí Kub, Jitka Vacínová, Hartmut Fuess
Publikováno v:
Journal of Physics: Condensed Matter. 14:5303-5314
X-ray specular reflectivity and diffuse scattering calculated using the traditional multilayer model, which assumes continuous, non-intersecting interfaces, are capable of fitting the experimental data obtained on multilayers with non-continuous inte
Publikováno v:
Thin Solid Films. 374:10-20
Magnetic multilayers consisting of repeated bilayers of cobalt and nickel or quadrilayers of cobalt, platinum, nickel and platinum were investigated using reflection and diffraction of X-rays. It was found that ultra-thin Co/Ni multilayers deposited
Publikováno v:
Physical Review B. 61:16144-16153
Autor:
M Šı〔cha, Z Hubička, V. Studnička, T. Wagner, Alexander Tarasenko, H Šı〔chová, Václav Valvoda, L. Soukup, František Fendrych, M. Novák, Dagmar Chvostova
Publikováno v:
Surface and Coatings Technology. :321-326
The RF plasma chemical reactor with low pressure supersonic plasma jet system (RPJ) has been used for deposition of Cu 3 N thin films. From comparison of experimental values of composition weight per cent with theoretically predicted ones, and from X
Publikováno v:
Surface and Coatings Technology. :284-291
TiAlN/CrN superlattice coatings have been grown in an industrial sized multiple target PVD coater by a combined steered arc/unbalanced magnetron process. The coatings were deposited using three Ti 0.5 Al 0.5 alloy targets and one Cr target. The power