Zobrazeno 1 - 7
of 7
pro vyhledávání: '"Uzzal Binit Bala"'
Publikováno v:
PIERS Online. 3:300-304
The electrostatic force microscope (EFM) is an important tool for imaging and characterizing material surfaces. In this paper a hybrid numerical approach for the simulation of the EFM considering charge distribution inside the sample under investigti
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ba0fcabe9992f128f7325edf3fda28eb
https://doi.org/10.2529/piers060908081435
https://doi.org/10.2529/piers060908081435
Publikováno v:
PIERS Online. 2:270-274
In this paper a hybrid numerical approach for the simulation of micro electro mechanical systems (MEMS) is presented. A simulation model that takes into account the mechanical and the electrical effects is developed. The model is applied to an electr
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7b8e09477480cd15dd2895390bc70bb9
https://doi.org/10.2529/piers050907123514
https://doi.org/10.2529/piers050907123514
Publikováno v:
Modelling, Simulation and Software Concepts for Scientific-Technological Problems ISBN: 9783642204890
Electrostatic force microscopes (EFM) and magnetic force microscopes (MFM) are very important tools for the investigation of electric and magnetic properties at the nanometer scale. Basically these measurement instruments are atomic force microscopes
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2690e13be7d35f1dd6661b9d63908b8f
https://doi.org/10.1007/978-3-642-20490-6_6
https://doi.org/10.1007/978-3-642-20490-6_6
Publikováno v:
COMPEL-The International Journal for Computation and Mathematics in Electrical and Electronic Engineering 28 (2009), Nr. 1
PurposeThe purpose of this paper is to present a hybrid numerical simulation approach for the calculation of potential and electric field distribution considering charge and dielectric constant.Design/methodology/approachEach numerical method has its
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::279e2340eb0168227a87c5d9125e6436
http://www.repo.uni-hannover.de/handle/123456789/2769
http://www.repo.uni-hannover.de/handle/123456789/2769
Publikováno v:
COMPEL-The International Journal for Computation and Mathematics in Electrical and Electronic Engineering 28 (2009), Nr. 1
PurposeThe purpose of this paper is to introduce a method which allows the calculation of the interactions of tip and sample of a magnetic force microscope as a first step to increase the accuracy of this technique.Design/methodology/approachThe emer
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b8791f722ed77a0cdaf0822192a39170
Publikováno v:
COMPEL; Jan2009, Vol. 28 Issue 1, p120-129, 10p
Publikováno v:
COMPEL; Jan2009, Vol. 28 Issue 1, p109-119, 11p